A single-trial event-related potential estimation based on independent component analysis and kalman smoother

Jingwei Zhang, Luzheng Bi*, Jinling Lian, Cuntai Guan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Abstract

Event-related potentials have been widely employed to develop brain-machine interface (BMI) systems. To improve the performance of such kind of BMI systems, how to extract P300 wave in a single trial has become an important research question in this field. In this paper, we propose a new approach for extracting P300 wave in a single trial by combining the independent component analysis (ICA) with Kalman smoother. The analysis results from two datasets show that the proposed approach can significantly improve the signal-to-noise ratio (SNR) of the P300 wave and performs better in P300 wave extraction in a single trial than a recursive least squares (RLS) filter.

Original languageEnglish
Title of host publicationAIM 2018 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages7-12
Number of pages6
ISBN (Print)9781538618547
DOIs
Publication statusPublished - 30 Aug 2018
Event2018 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2018 - Auckland, New Zealand
Duration: 9 Jul 201812 Jul 2018

Publication series

NameIEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM
Volume2018-July

Conference

Conference2018 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2018
Country/TerritoryNew Zealand
CityAuckland
Period9/07/1812/07/18

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Zhang, J., Bi, L., Lian, J., & Guan, C. (2018). A single-trial event-related potential estimation based on independent component analysis and kalman smoother. In AIM 2018 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics (pp. 7-12). Article 8452280 (IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM; Vol. 2018-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/AIM.2018.8452280