A New Methodology to Build the ICEM-CE Model for Microcontroller Units

Li Yuanhao; Xie Shuguo; Chen Yishu

doi:10.1109/iWEM53379.2021.9790696

A New Methodology to Build the ICEM-CE Model for Microcontroller Units

Li Yuanhao, Xie Shuguo, Chen Yishu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In order to predict the conduction emission performance of a circuit board, manufacturers need to provide the electromagnetic compatibility (EMC) model of the chip to users. The Integrated circuit emission model-conducted emissions (ICEM-CE) modelling method proposed in standard IEC62433-2 can target various active chips, but lacks specificity for chips with typical characteristics of electromagnetic compatibility. In this paper, we propose a parametric model construction method for microcontroller units (MCUs). By studying the characteristics of the internal activity (IA) of the MCUs, the universal prior information for MCUs is obtained, and the parameterized model is constructed.

Original language	English
Title of host publication	IEEE International Workshop on Electromagnetics
Subtitle of host publication	Applications and Student Innovation Competition, iWEM 2021 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665418287
DOIs	https://doi.org/10.1109/iWEM53379.2021.9790696
Publication status	Published - 2021
Externally published	Yes
Event	2021 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Guangzhou, China Duration: 28 Nov 2021 → 30 Nov 2021

Publication series

Name	IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings

Conference

Conference	2021 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021
Country/Territory	China
City	Guangzhou
Period	28/11/21 → 30/11/21

Keywords

Elecomagnetic compatibility
conducted emission
microcontroller units
parametric model

Access to Document

10.1109/iWEM53379.2021.9790696

Cite this

Yuanhao, L., Shuguo, X., & Yishu, C. (2021). A New Methodology to Build the ICEM-CE Model for Microcontroller Units. In IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings (IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/iWEM53379.2021.9790696

Yuanhao, Li ; Shuguo, Xie ; Yishu, Chen. / A New Methodology to Build the ICEM-CE Model for Microcontroller Units. IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings).

@inproceedings{266f80c79f6f40c7a58dfe57cacba89c,

title = "A New Methodology to Build the ICEM-CE Model for Microcontroller Units",

abstract = "In order to predict the conduction emission performance of a circuit board, manufacturers need to provide the electromagnetic compatibility (EMC) model of the chip to users. The Integrated circuit emission model-conducted emissions (ICEM-CE) modelling method proposed in standard IEC62433-2 can target various active chips, but lacks specificity for chips with typical characteristics of electromagnetic compatibility. In this paper, we propose a parametric model construction method for microcontroller units (MCUs). By studying the characteristics of the internal activity (IA) of the MCUs, the universal prior information for MCUs is obtained, and the parameterized model is constructed.",

keywords = "Elecomagnetic compatibility, conducted emission, microcontroller units, parametric model",

author = "Li Yuanhao and Xie Shuguo and Chen Yishu",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 2021 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 ; Conference date: 28-11-2021 Through 30-11-2021",

year = "2021",

doi = "10.1109/iWEM53379.2021.9790696",

language = "English",

series = "IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "IEEE International Workshop on Electromagnetics",

address = "United States",

}

Yuanhao, L, Shuguo, X & Yishu, C 2021, A New Methodology to Build the ICEM-CE Model for Microcontroller Units. in IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings. IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2021 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021, Guangzhou, China, 28/11/21. https://doi.org/10.1109/iWEM53379.2021.9790696

A New Methodology to Build the ICEM-CE Model for Microcontroller Units. / Yuanhao, Li; Shuguo, Xie; Yishu, Chen.
IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A New Methodology to Build the ICEM-CE Model for Microcontroller Units

AU - Yuanhao, Li

AU - Shuguo, Xie

AU - Yishu, Chen

PY - 2021

Y1 - 2021

N2 - In order to predict the conduction emission performance of a circuit board, manufacturers need to provide the electromagnetic compatibility (EMC) model of the chip to users. The Integrated circuit emission model-conducted emissions (ICEM-CE) modelling method proposed in standard IEC62433-2 can target various active chips, but lacks specificity for chips with typical characteristics of electromagnetic compatibility. In this paper, we propose a parametric model construction method for microcontroller units (MCUs). By studying the characteristics of the internal activity (IA) of the MCUs, the universal prior information for MCUs is obtained, and the parameterized model is constructed.

AB - In order to predict the conduction emission performance of a circuit board, manufacturers need to provide the electromagnetic compatibility (EMC) model of the chip to users. The Integrated circuit emission model-conducted emissions (ICEM-CE) modelling method proposed in standard IEC62433-2 can target various active chips, but lacks specificity for chips with typical characteristics of electromagnetic compatibility. In this paper, we propose a parametric model construction method for microcontroller units (MCUs). By studying the characteristics of the internal activity (IA) of the MCUs, the universal prior information for MCUs is obtained, and the parameterized model is constructed.

KW - Elecomagnetic compatibility

KW - conducted emission

KW - microcontroller units

KW - parametric model

UR - http://www.scopus.com/inward/record.url?scp=85132976428&partnerID=8YFLogxK

U2 - 10.1109/iWEM53379.2021.9790696

DO - 10.1109/iWEM53379.2021.9790696

M3 - Conference contribution

AN - SCOPUS:85132976428

T3 - IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings

BT - IEEE International Workshop on Electromagnetics

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2021 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021

Y2 - 28 November 2021 through 30 November 2021

ER -

Yuanhao L, Shuguo X, Yishu C. A New Methodology to Build the ICEM-CE Model for Microcontroller Units. In IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2021. (IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings). doi: 10.1109/iWEM53379.2021.9790696

A New Methodology to Build the ICEM-CE Model for Microcontroller Units

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this