A new method used for measuring the parameter of elastic thin-neck based on CCD aiming

Jiwen Cui; Lirong Qiu; Guoliang Jin; Jiubin Tan

A new method used for measuring the parameter of elastic thin-neck based on CCD aiming

Jiwen Cui^*, Lirong Qiu, Guoliang Jin, Jiubin Tan

^*Corresponding author for this work

Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

A new method used in measuring the parameter of elastic thin-neck is presented because of the shortage in measuring these parameter on old methods. The method utilizes high precision CCD to aim, high precision raster to measure, rotate the work-platform to acquire the parameter of the elastic thin-neck. The technology of using CCD to aim is applied in the method, and the method is belonged to non-contacted method, as a result to avoid the micro-distortion formed by the micro measuring force. The method can take full advantage of information received by CCD, and have high precision. The experimental result shows that the uncertainty of this method can be up to 0.3μm.

Original language	English
Title of host publication	Proceedings of the Second International Symposium on Instrumentation Science and Technology
Editors	T. Jiubin, W. Xianfang, T. Jiubin, W. Xianfang
Pages	2/799-2/803
Publication status	Published - 2002
Externally published	Yes
Event	Proceedings of the second International Symposium on Instrumentation Science and Technology - Jinan, China Duration: 18 Aug 2002 → 22 Aug 2002

Publication series

Name	Proceedings of the Second International Symposium on Instrumentation Science and Technology
Volume	2

Conference

Conference	Proceedings of the second International Symposium on Instrumentation Science and Technology
Country/Territory	China
City	Jinan
Period	18/08/02 → 22/08/02

Keywords

Auto-focus
Elastic thin-neck
Encoder
Location in subpixel

Cite this

Cui, J., Qiu, L., Jin, G., & Tan, J. (2002). A new method used for measuring the parameter of elastic thin-neck based on CCD aiming. In T. Jiubin, W. Xianfang, T. Jiubin, & W. Xianfang (Eds.), Proceedings of the Second International Symposium on Instrumentation Science and Technology (pp. 2/799-2/803). (Proceedings of the Second International Symposium on Instrumentation Science and Technology; Vol. 2).

Cui, Jiwen ; Qiu, Lirong ; Jin, Guoliang et al. / A new method used for measuring the parameter of elastic thin-neck based on CCD aiming. Proceedings of the Second International Symposium on Instrumentation Science and Technology. editor / T. Jiubin ; W. Xianfang ; T. Jiubin ; W. Xianfang. 2002. pp. 2/799-2/803 (Proceedings of the Second International Symposium on Instrumentation Science and Technology).

@inproceedings{e91715512bca42b5a1b4d9f08e9ffa15,

title = "A new method used for measuring the parameter of elastic thin-neck based on CCD aiming",

abstract = "A new method used in measuring the parameter of elastic thin-neck is presented because of the shortage in measuring these parameter on old methods. The method utilizes high precision CCD to aim, high precision raster to measure, rotate the work-platform to acquire the parameter of the elastic thin-neck. The technology of using CCD to aim is applied in the method, and the method is belonged to non-contacted method, as a result to avoid the micro-distortion formed by the micro measuring force. The method can take full advantage of information received by CCD, and have high precision. The experimental result shows that the uncertainty of this method can be up to 0.3μm.",

keywords = "Auto-focus, Elastic thin-neck, Encoder, Location in subpixel",

author = "Jiwen Cui and Lirong Qiu and Guoliang Jin and Jiubin Tan",

year = "2002",

language = "English",

isbn = "7560317685",

series = "Proceedings of the Second International Symposium on Instrumentation Science and Technology",

pages = "2/799--2/803",

editor = "T. Jiubin and W. Xianfang and T. Jiubin and W. Xianfang",

booktitle = "Proceedings of the Second International Symposium on Instrumentation Science and Technology",

note = "Proceedings of the second International Symposium on Instrumentation Science and Technology ; Conference date: 18-08-2002 Through 22-08-2002",

}

Cui, J, Qiu, L, Jin, G & Tan, J 2002, A new method used for measuring the parameter of elastic thin-neck based on CCD aiming. in T Jiubin, W Xianfang, T Jiubin & W Xianfang (eds), Proceedings of the Second International Symposium on Instrumentation Science and Technology. Proceedings of the Second International Symposium on Instrumentation Science and Technology, vol. 2, pp. 2/799-2/803, Proceedings of the second International Symposium on Instrumentation Science and Technology, Jinan, China, 18/08/02.

A new method used for measuring the parameter of elastic thin-neck based on CCD aiming. / Cui, Jiwen; Qiu, Lirong; Jin, Guoliang et al.
Proceedings of the Second International Symposium on Instrumentation Science and Technology. ed. / T. Jiubin; W. Xianfang; T. Jiubin; W. Xianfang. 2002. p. 2/799-2/803 (Proceedings of the Second International Symposium on Instrumentation Science and Technology; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A new method used for measuring the parameter of elastic thin-neck based on CCD aiming

AU - Cui, Jiwen

AU - Qiu, Lirong

AU - Jin, Guoliang

AU - Tan, Jiubin

PY - 2002

Y1 - 2002

N2 - A new method used in measuring the parameter of elastic thin-neck is presented because of the shortage in measuring these parameter on old methods. The method utilizes high precision CCD to aim, high precision raster to measure, rotate the work-platform to acquire the parameter of the elastic thin-neck. The technology of using CCD to aim is applied in the method, and the method is belonged to non-contacted method, as a result to avoid the micro-distortion formed by the micro measuring force. The method can take full advantage of information received by CCD, and have high precision. The experimental result shows that the uncertainty of this method can be up to 0.3μm.

AB - A new method used in measuring the parameter of elastic thin-neck is presented because of the shortage in measuring these parameter on old methods. The method utilizes high precision CCD to aim, high precision raster to measure, rotate the work-platform to acquire the parameter of the elastic thin-neck. The technology of using CCD to aim is applied in the method, and the method is belonged to non-contacted method, as a result to avoid the micro-distortion formed by the micro measuring force. The method can take full advantage of information received by CCD, and have high precision. The experimental result shows that the uncertainty of this method can be up to 0.3μm.

KW - Auto-focus

KW - Elastic thin-neck

KW - Encoder

KW - Location in subpixel

UR - http://www.scopus.com/inward/record.url?scp=0141768211&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0141768211

SN - 7560317685

T3 - Proceedings of the Second International Symposium on Instrumentation Science and Technology

SP - 2/799-2/803

BT - Proceedings of the Second International Symposium on Instrumentation Science and Technology

A2 - Jiubin, T.

A2 - Xianfang, W.

A2 - Jiubin, T.

A2 - Xianfang, W.

T2 - Proceedings of the second International Symposium on Instrumentation Science and Technology

Y2 - 18 August 2002 through 22 August 2002

ER -

Cui J, Qiu L, Jin G, Tan J. A new method used for measuring the parameter of elastic thin-neck based on CCD aiming. In Jiubin T, Xianfang W, Jiubin T, Xianfang W, editors, Proceedings of the Second International Symposium on Instrumentation Science and Technology. 2002. p. 2/799-2/803. (Proceedings of the Second International Symposium on Instrumentation Science and Technology).

A new method used for measuring the parameter of elastic thin-neck based on CCD aiming

Abstract

Publication series

Conference

Keywords

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