A general solution to the maximum detachment force in thin film peeling

Hanbin Yin, Zhilong Peng, Yin Yao, Shaohua Chen*, Huajian Gao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

While it is well known that the steady-state detachment force during 90° peeling of an elastic film on a rigid substrate provides a simple and powerful method to determine the interfacial work of adhesion, the situation is less clear for the maximum detachment force associated with the peeling process. Here, we propose a general solution to this maximum detachment force during 90° peeling, which is shown to depend on the interfacial work of adhesion, interfacial strength, bending modulus of the film, as well as an interfacial cohesive law shape factor. Combining this solution with Kendall's classical model provides a method that allows the interfacial work of adhesion and interfacial strength of a film-substrate system to be simultaneously determined via peeling test.

Original languageEnglish
Article number111546
JournalInternational Journal of Solids and Structures
Volume242
DOIs
Publication statusPublished - 1 May 2022

Keywords

  • Film-substrate system
  • Interfacial strength
  • Interfacial work of adhesion
  • Maximum detachment force
  • Peeling
  • Shape effect
  • Traction-separation law

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