3-D near-field millimeter wave imaging based on stepped frequency system

Yu Sun; Wei Dong Hu; Xiang Xin Meng; Xin Lv

doi:10.1109/IMWS-AMP.2015.7324913

3-D near-field millimeter wave imaging based on stepped frequency system

Yu Sun, Wei Dong Hu, Xiang Xin Meng, Xin Lv

School of Integrated Circuits and Electronics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

Millimeter wave have many advantages compared with microwave, a millimeter wave radar system based on stepped frequency pulse signal can be used to near-field imaging. The wave number domain algorithm is used to mechanical scanning data that achieved by a two-dimensional (2-D) planar aperture with the radar system to reconstruct three-dimensional (3-D) reflectivity image. Results show the efficiency and accurate image reconstruction and highly resolution.

Original language	English
Title of host publication	2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781479964505
DOIs	https://doi.org/10.1109/IMWS-AMP.2015.7324913
Publication status	Published - 10 Nov 2015
Event	IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Suzhou, China Duration: 1 Jul 2015 → 3 Jul 2015

Publication series

Name	2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings

Conference

Conference	IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015
Country/Territory	China
City	Suzhou
Period	1/07/15 → 3/07/15

Keywords

Millimeter wave
reflectivity image
stepped frequency
wave number domain algorithm

Access to Document

10.1109/IMWS-AMP.2015.7324913

Cite this

Sun, Y., Hu, W. D., Meng, X. X., & Lv, X. (2015). 3-D near-field millimeter wave imaging based on stepped frequency system. In 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings Article 7324913 (2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMWS-AMP.2015.7324913

Sun, Yu ; Hu, Wei Dong ; Meng, Xiang Xin et al. / 3-D near-field millimeter wave imaging based on stepped frequency system. 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2015. (2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings).

@inproceedings{7af11ce5032b4acf9361d4d61b02576b,

title = "3-D near-field millimeter wave imaging based on stepped frequency system",

abstract = "Millimeter wave have many advantages compared with microwave, a millimeter wave radar system based on stepped frequency pulse signal can be used to near-field imaging. The wave number domain algorithm is used to mechanical scanning data that achieved by a two-dimensional (2-D) planar aperture with the radar system to reconstruct three-dimensional (3-D) reflectivity image. Results show the efficiency and accurate image reconstruction and highly resolution.",

keywords = "Millimeter wave, reflectivity image, stepped frequency, wave number domain algorithm",

author = "Yu Sun and Hu, {Wei Dong} and Meng, {Xiang Xin} and Xin Lv",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 ; Conference date: 01-07-2015 Through 03-07-2015",

year = "2015",

month = nov,

day = "10",

doi = "10.1109/IMWS-AMP.2015.7324913",

language = "English",

series = "2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings",

address = "United States",

}

Sun, Y, Hu, WD, Meng, XX & Lv, X 2015, 3-D near-field millimeter wave imaging based on stepped frequency system. in 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings., 7324913, 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings, Institute of Electrical and Electronics Engineers Inc., IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015, Suzhou, China, 1/07/15. https://doi.org/10.1109/IMWS-AMP.2015.7324913

3-D near-field millimeter wave imaging based on stepped frequency system. / Sun, Yu; Hu, Wei Dong; Meng, Xiang Xin et al.
2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2015. 7324913 (2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - 3-D near-field millimeter wave imaging based on stepped frequency system

AU - Sun, Yu

AU - Hu, Wei Dong

AU - Meng, Xiang Xin

AU - Lv, Xin

PY - 2015/11/10

Y1 - 2015/11/10

N2 - Millimeter wave have many advantages compared with microwave, a millimeter wave radar system based on stepped frequency pulse signal can be used to near-field imaging. The wave number domain algorithm is used to mechanical scanning data that achieved by a two-dimensional (2-D) planar aperture with the radar system to reconstruct three-dimensional (3-D) reflectivity image. Results show the efficiency and accurate image reconstruction and highly resolution.

AB - Millimeter wave have many advantages compared with microwave, a millimeter wave radar system based on stepped frequency pulse signal can be used to near-field imaging. The wave number domain algorithm is used to mechanical scanning data that achieved by a two-dimensional (2-D) planar aperture with the radar system to reconstruct three-dimensional (3-D) reflectivity image. Results show the efficiency and accurate image reconstruction and highly resolution.

KW - Millimeter wave

KW - reflectivity image

KW - stepped frequency

KW - wave number domain algorithm

UR - http://www.scopus.com/inward/record.url?scp=84962432646&partnerID=8YFLogxK

U2 - 10.1109/IMWS-AMP.2015.7324913

DO - 10.1109/IMWS-AMP.2015.7324913

M3 - Conference contribution

AN - SCOPUS:84962432646

T3 - 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings

BT - 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015

Y2 - 1 July 2015 through 3 July 2015

ER -

Sun Y, Hu WD, Meng XX, Lv X. 3-D near-field millimeter wave imaging based on stepped frequency system. In 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2015. 7324913. (2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings). doi: 10.1109/IMWS-AMP.2015.7324913

3-D near-field millimeter wave imaging based on stepped frequency system

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