一种低功耗MEMS压阻式传感器的动态测试系统

Translated title of the contribution: A Low-Power MEMS Piezoresistive Sensor Dynamic Test System

Feng Liu, Lei Jin, Shao Hua Niu, Hai Peng Liu, Jian Chang Guo

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

In order to accurately analyze the penetrating overload signal, a low-power, high-load dynamic test system was proposed. The system could withstand 2×105g overload signals. In order to achieve the characteristics of high sampling rate, low power consumption, and shock resistance, the system adopted silicon crystal oscillator as the main oscillator, using low-power CMOS chips. When the system started to work, the processor entered the deep sleep mode and started to supply power to the peripheral circuit when entering the transmit mode. When the missile emitted a signal, a trigger signal from the hysteresis trigger circuit would be generated, so the acquisition system was started to collect data. Experiments have shown that with this scheme, the life cycle of the missile can be prolonged, and the overload signal of the air gun can be accurately collected.

Translated title of the contributionA Low-Power MEMS Piezoresistive Sensor Dynamic Test System
Original languageChinese (Traditional)
Pages (from-to)215-220
Number of pages6
JournalBeijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
Volume39
Issue number2
DOIs
Publication statusPublished - 1 Feb 2019

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