Submicron centroid position measurement method of screw connected structure under temperature load

Xiao Chen, Muzheng Xiao*, Zifu Wang, Zhijing Zhang, Xin Jin

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

摘要

This paper presents a submicron centroid position measurement method. Two laser displacement sensors are placed in the two ends of a screw connected structure for a real-time measurement. The entire measuring device is placed in a temperature controllable environment to measure the position change of the screw connected structure while temperature load is applied. The centroid position change of screw connected structure is calculated from the measured data. Uncertainty of the measurement method is analysed and a measurement experiment is carried out on the design structure. Under the action of a pre-tightening force about 400 N and a temperature change of 40°C, the maximum centroid position change of the structure is 7.46 μm. Finally, simulation based on surface form error of the measured structure is carried out to confirm that the measurement method proposed in this paper is effective.

源语言英语
页(从-至)287-298
页数12
期刊International Journal of Nanomanufacturing
16
4
DOI
出版状态已出版 - 2020

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