Three-dimensional imaging of microstructures by an improved compact digital holographic microscope (ICDHM) with dual wavelength

Yongfu Wen*, Weijuan Qu, Haobo Cheng, Anand Asundi

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An improved compact digital holographic microscope (ICDHM) is developed for three-dimensional imaging of microstructures. This system is based on lensless magnification using a diverging wave. A point source generated by a long working distance microscope objective is located into the cube beam-splitter to get a higher numerical aperture (NA) of the system. The lateral resolution and the field-of-view of the system are confirmed with a calibration experiment. For the case of the optical path lengths (OPL) of object with step pattern larger than the wavelength, the traditional phase unwrapping algorithms cannot be unequivocally determinate, resulting in a 2π phase ambiguity. To solve this problem, dual wavelength phase unwrapping method was integrated into ICDHM, which extends the measuring capability of ICDHM over several microns of range. The experimental results demonstrate that the developed system is well suitable for the measurement of MEMS and Micro systems samples with high resolution.

Original languageEnglish
Title of host publicationInternational Conference on Optical and Photonic Engineering, icOPEN 2015
EditorsYu Fu, Anand K. Asundi
PublisherSPIE
ISBN (Electronic)9781628416848
DOIs
Publication statusPublished - 2015
Event3rd International Conference on Optical and Photonic Engineering, icOPEN 2015 - Singapore, Singapore
Duration: 14 Apr 201516 Apr 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9524
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference3rd International Conference on Optical and Photonic Engineering, icOPEN 2015
Country/TerritorySingapore
CitySingapore
Period14/04/1516/04/15

Keywords

  • Digital holography microscopy
  • Dual wavelength
  • MEMS
  • Three-dimension measurement

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