Study on the feature matching of fingerprints

Xiao Bing Wu; Xue Shan Gao; Yun Ting Pang; Ke Jie Li

Study on the feature matching of fingerprints

Xiao Bing Wu^*, Xue Shan Gao, Yun Ting Pang, Ke Jie Li

^*Corresponding author for this work

School of Mechatronical Engineering

Beijing Institute of Technology

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Some key problems on fingerprint minutiae matching are discussed. The quality of minutiae in the overlapping region and their matching are used to help in judging the comparability of two fingerprints. The local pattern method is used to get the optimal matching. Experiments show that these methods can accelerate the matching process and improve the matching precision.

Original language	English
Pages (from-to)	508-511
Number of pages	4
Journal	Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
Volume	26
Issue number	6
Publication status	Published - Jun 2006

Keywords

Feature match
Fingerprint
Local pattern

Cite this

Wu, X. B., Gao, X. S., Pang, Y. T., & Li, K. J. (2006). Study on the feature matching of fingerprints. Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology, 26(6), 508-511.

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title = "Study on the feature matching of fingerprints",

abstract = "Some key problems on fingerprint minutiae matching are discussed. The quality of minutiae in the overlapping region and their matching are used to help in judging the comparability of two fingerprints. The local pattern method is used to get the optimal matching. Experiments show that these methods can accelerate the matching process and improve the matching precision.",

keywords = "Feature match, Fingerprint, Local pattern",

author = "Wu, {Xiao Bing} and Gao, {Xue Shan} and Pang, {Yun Ting} and Li, {Ke Jie}",

year = "2006",

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AU - Wu, Xiao Bing

AU - Gao, Xue Shan

AU - Pang, Yun Ting

AU - Li, Ke Jie

PY - 2006/6

Y1 - 2006/6

N2 - Some key problems on fingerprint minutiae matching are discussed. The quality of minutiae in the overlapping region and their matching are used to help in judging the comparability of two fingerprints. The local pattern method is used to get the optimal matching. Experiments show that these methods can accelerate the matching process and improve the matching precision.

AB - Some key problems on fingerprint minutiae matching are discussed. The quality of minutiae in the overlapping region and their matching are used to help in judging the comparability of two fingerprints. The local pattern method is used to get the optimal matching. Experiments show that these methods can accelerate the matching process and improve the matching precision.

KW - Feature match

KW - Fingerprint

KW - Local pattern

UR - http://www.scopus.com/inward/record.url?scp=33748150005&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:33748150005

SN - 1001-0645

VL - 26

SP - 508

EP - 511

JO - Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology

JF - Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology

IS - 6

ER -

Study on the feature matching of fingerprints

Abstract

Keywords

Other files and links

Fingerprint

Cite this