Abstract
Some key problems on fingerprint minutiae matching are discussed. The quality of minutiae in the overlapping region and their matching are used to help in judging the comparability of two fingerprints. The local pattern method is used to get the optimal matching. Experiments show that these methods can accelerate the matching process and improve the matching precision.
| Original language | English |
|---|---|
| Pages (from-to) | 508-511 |
| Number of pages | 4 |
| Journal | Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology |
| Volume | 26 |
| Issue number | 6 |
| Publication status | Published - Jun 2006 |
Keywords
- Feature match
- Fingerprint
- Local pattern