Self-calibration and high-accuracy detection technology for the probability density of polarization state of a light field

Wenhao Pan, Jianhui Li, Tianlei Ning, Yanqiu Li, Ke Liu, Lihui Liu, Meng Zheng

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Measurement of the probability density of polarization state need specific phase modulator.However, the existence of mechanic processing error results in the error of the polarization property of modulator. Meanwhile, the error of the measurement system's alignment is also existing. All of this errors need to calibrate to ensure the accuracy of measurement. In this paper, We present a self-calibration method based on the theory of the probability density of polarization state which is represented in Mueller formalism. After measuring the probability density of polarization state, we can extract the Stokes parameters of a light field of unknown polarization in a single irradiance measurement, by finding the maximum of the probability density of polarization state.

Original languageEnglish
Title of host publicationOptical Precision Manufacturing, Testing, and Applications
EditorsJohn W. McBride, Xuejun Zhang, Sen Han, JiuBin Tan
PublisherSPIE
ISBN (Electronic)9781510623361
DOIs
Publication statusPublished - 2018
EventInternational Symposium on Optoelectronic Technology and Application 2018: Optical Precision Manufacturing, Testing, and Applications, OTA 2018 - Beijing, China
Duration: 22 May 201824 May 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10847
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInternational Symposium on Optoelectronic Technology and Application 2018: Optical Precision Manufacturing, Testing, and Applications, OTA 2018
Country/TerritoryChina
CityBeijing
Period22/05/1824/05/18

Keywords

  • Mueller matrix
  • Polarization measurement
  • Probability density of polarization state
  • Self-calibration

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