Realization of four-pass I2 absorption cell in 532-nm optical frequency standard

Er Jun Zang*, Jian Ping Cao, Ye Li, Cheng Yang Li, Yong Kai Deng, Chun Qing Gao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

70 Citations (Scopus)

Abstract

Several innovations have been adopted in our portable 532-nm optical frequency standard. Particularly, we realized a four-pass scheme equivalent to 1.8-m I2 absorption length, which gives adequate signal-to-noise ratio (∼170 in a 10-kHz bandwidth). In addition, an active feedback control has been designed and implemented. The fluctuations of the residual-amplitude modulation in the electrooptic modulator have been successfully suppressed. As a result, the laser-frequency stability is greatly improved. When both lasers are locked on the same molecular iodine transition line of R (56) 32-0: α10, the Allan deviation is lower than 2.3 × 10 -14 at 1-s averaging time, reaching the flicker floor at about 4 × 10-15 after 200 s. The maximum frequency excursion at 532 nm is about 175 Hz during a continuous measuring time of 150 000 s.

Original languageEnglish
Pages (from-to)673-676
Number of pages4
JournalIEEE Transactions on Instrumentation and Measurement
Volume56
Issue number2
DOIs
Publication statusPublished - Apr 2007

Keywords

  • Four-pass scheme
  • Laser-frequency stability
  • Modulation-transfer spectroscopy
  • Monolithic laser
  • Residual-amplitude modulation (RAM)

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