Zhou, Y., Fox, D. S., Maguire, P., O'Connell, R., Masters, R., Rodenburg, C., Wu, H., Dapor, M., Chen, Y., & Zhang, H. (2016). Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. Scientific Reports, 6, Article 21045. https://doi.org/10.1038/srep21045
Zhou, Yangbo ; Fox, Daniel S. ; Maguire, Pierce et al. / Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. In: Scientific Reports. 2016 ; Vol. 6.
@article{b49aecfc56cb46a280c57819a64f5dc4,
title = "Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene",
abstract = "Two-dimensional (2D) materials usually have a layer-dependent work function, which require fast and accurate detection for the evaluation of their device performance. A detection technique with high throughput and high spatial resolution has not yet been explored. Using a scanning electron microscope, we have developed and implemented a quantitative analytical technique which allows effective extraction of the work function of graphene. This technique uses the secondary electron contrast and has nanometre-resolved layer information. The measurement of few-layer graphene flakes shows the variation of work function between graphene layers with a precision of less than 10 meV. It is expected that this technique will prove extremely useful for researchers in a broad range of fields due to its revolutionary throughput and accuracy.",
author = "Yangbo Zhou and Fox, {Daniel S.} and Pierce Maguire and Robert O'Connell and Robert Masters and Cornelia Rodenburg and Hanchun Wu and Maurizio Dapor and Ying Chen and Hongzhou Zhang",
year = "2016",
month = feb,
day = "16",
doi = "10.1038/srep21045",
language = "English",
volume = "6",
journal = "Scientific Reports",
issn = "2045-2322",
publisher = "Nature Publishing Group",
}
Zhou, Y, Fox, DS, Maguire, P, O'Connell, R, Masters, R, Rodenburg, C, Wu, H, Dapor, M, Chen, Y & Zhang, H 2016, 'Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene', Scientific Reports, vol. 6, 21045. https://doi.org/10.1038/srep21045
Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. / Zhou, Yangbo; Fox, Daniel S.; Maguire, Pierce et al.
In:
Scientific Reports, Vol. 6, 21045, 16.02.2016.
Research output: Contribution to journal › Article › peer-review
TY - JOUR
T1 - Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene
AU - Zhou, Yangbo
AU - Fox, Daniel S.
AU - Maguire, Pierce
AU - O'Connell, Robert
AU - Masters, Robert
AU - Rodenburg, Cornelia
AU - Wu, Hanchun
AU - Dapor, Maurizio
AU - Chen, Ying
AU - Zhang, Hongzhou
PY - 2016/2/16
Y1 - 2016/2/16
N2 - Two-dimensional (2D) materials usually have a layer-dependent work function, which require fast and accurate detection for the evaluation of their device performance. A detection technique with high throughput and high spatial resolution has not yet been explored. Using a scanning electron microscope, we have developed and implemented a quantitative analytical technique which allows effective extraction of the work function of graphene. This technique uses the secondary electron contrast and has nanometre-resolved layer information. The measurement of few-layer graphene flakes shows the variation of work function between graphene layers with a precision of less than 10 meV. It is expected that this technique will prove extremely useful for researchers in a broad range of fields due to its revolutionary throughput and accuracy.
AB - Two-dimensional (2D) materials usually have a layer-dependent work function, which require fast and accurate detection for the evaluation of their device performance. A detection technique with high throughput and high spatial resolution has not yet been explored. Using a scanning electron microscope, we have developed and implemented a quantitative analytical technique which allows effective extraction of the work function of graphene. This technique uses the secondary electron contrast and has nanometre-resolved layer information. The measurement of few-layer graphene flakes shows the variation of work function between graphene layers with a precision of less than 10 meV. It is expected that this technique will prove extremely useful for researchers in a broad range of fields due to its revolutionary throughput and accuracy.
UR - http://www.scopus.com/inward/record.url?scp=84958279777&partnerID=8YFLogxK
U2 - 10.1038/srep21045
DO - 10.1038/srep21045
M3 - Article
AN - SCOPUS:84958279777
SN - 2045-2322
VL - 6
JO - Scientific Reports
JF - Scientific Reports
M1 - 21045
ER -
Zhou Y, Fox DS, Maguire P, O'Connell R, Masters R, Rodenburg C et al. Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. Scientific Reports. 2016 Feb 16;6:21045. doi: 10.1038/srep21045
