TY - JOUR
T1 - Probing Charge Reversal of Zwitterion at Defects on Self-Assembled Monolayers by Scanning Electrochemical Microscopy
AU - Huang, Ximing
AU - Chen, Jingchao
AU - Yan, Chunxia
AU - Guo, Haixia
AU - Shao, Huibo
N1 - Publisher Copyright:
Copyright © 2020 American Chemical Society.
PY - 2020/4/23
Y1 - 2020/4/23
N2 - Defects on self-assembled monolayers (SAMs) could have detrimental impact on their functionalities; thus, to optimize performances, researchers seek to manipulate the defects of SAMs. In this work, we functionalized the defects of 1-undecanethiol SAMs using a zwitterion, cysteine. This modification with cysteine endowed the defects with a specific behavior of charge reversal. Scanning electrochemical microscopy and cyclic voltammetry both fully exhibited this charge reversal behavior. This peculiar ability of charge reversal at the defects would endow the SAMs specific functions: the SAMs have reversible electrochemical response to charged molecules. On the basis of this principle, the functionalized SAMs could be applied in specific amino acids recognition. This work supplied a practical way to take advantage of the defects of SAMs and offers some contribution to the fields of defect engineering and molecular recognition.
AB - Defects on self-assembled monolayers (SAMs) could have detrimental impact on their functionalities; thus, to optimize performances, researchers seek to manipulate the defects of SAMs. In this work, we functionalized the defects of 1-undecanethiol SAMs using a zwitterion, cysteine. This modification with cysteine endowed the defects with a specific behavior of charge reversal. Scanning electrochemical microscopy and cyclic voltammetry both fully exhibited this charge reversal behavior. This peculiar ability of charge reversal at the defects would endow the SAMs specific functions: the SAMs have reversible electrochemical response to charged molecules. On the basis of this principle, the functionalized SAMs could be applied in specific amino acids recognition. This work supplied a practical way to take advantage of the defects of SAMs and offers some contribution to the fields of defect engineering and molecular recognition.
UR - http://www.scopus.com/inward/record.url?scp=85085134816&partnerID=8YFLogxK
U2 - 10.1021/acs.jpcc.0c01661
DO - 10.1021/acs.jpcc.0c01661
M3 - Article
AN - SCOPUS:85085134816
SN - 1932-7447
VL - 124
SP - 8876
EP - 8884
JO - Journal of Physical Chemistry C
JF - Journal of Physical Chemistry C
IS - 16
ER -