Abstract
The CNx thin film was deposited on Si(100) substrate from a saturated acetone solution of cyanuric trichloride and melamine (cyanuric trichloride/melamine=1: 1.5) at room temperature. X-ray diffraction (XRD) results showed that the diffraction peaks in the pattern coincided well with those of graphite-like carbon nitride calculated in the literature. The lattice constants (a=4.79 Å, c=6.90 Å) for g-C3N4 matched with those of ab initio calculations (a=4.74 Å, c=6.72 Å) quite well. X-ray photoelectron spectroscopy (XPS) measurements indicated that the elements in the deposited films were mostly of C and N (N/C=0.75), and N (400.00 eV) bonded with C (287.72 eV) in the form of six-member C 3N3 ring. The peaks at 800 cm-1, 1310 cm -1 and 1610 cm-1 in the Fourier transform infrared (FTIR) spectrum indicated that triazine ring existed in the product. These results demonstrated that crystalline g-C3N4 was obtained in the CNx film.
Original language | English |
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Pages (from-to) | 1737-1740 |
Number of pages | 4 |
Journal | Chinese Science Bulletin |
Volume | 48 |
Issue number | 16 |
DOIs | |
Publication status | Published - 2003 |
Keywords
- CN thin film
- Electrodeposition
- Graphitic carbon nitride
- IR
- XPS
- XRD