TY - GEN
T1 - Measurement of the mechanical properties of living cell using micro hand and developed AFM system
AU - Nishi, Daisuke
AU - Arai, Tatsuo
AU - Inoue, Kenji
AU - Takubo, Tomohito
PY - 2005
Y1 - 2005
N2 - In this paper, the mechanical properties of yeast cell are determined by means of the developed two-fingered micro hand and an atomic force microscope (AFM). The micro hand has excellent absolute positioning accuracy after the elaborated calibration, and is typically capable of obtaining less than several hundred nanometer of positioning accuracy by human teleoperation. The authors also developed an AFM system of our own composition. The AFM consists of a laser diode module, a cantilever, a 4-segment photodiode and output circuit. The task to measure the mechanical properties of cells include moving of the fingers from the home position to the target object(cell), then picking and grasping it, moving it to a target position(AFM tip), and finally pushing it against the cantilever tip. However, since it is difficult to stabilize the sample, the authors utilized the capillary phenomenon, i.e. the liquid inside the tube-shaped object ascends the inner wall in order to stabilize the sample strongly. And force-indentation relation were obtained applying a force to individual yeast cells by moving the sample to the cantilever tip. Force is automatically calculated from the cantilever deflection measured with a lazer beam and a quadrature photodiode, while indentation is obtained from the difference between the movement of the micro hand and that of the cantilever tip caused by cantilever deflection. The mechanical properties of yeast cells is finally determined using the produced force-indentation curves, the Hertz model and FIEL(force indentation to equal limits) mapping, which is an analytical way for determinating relative microelastic properties from force volumes of viscoelastic materials.
AB - In this paper, the mechanical properties of yeast cell are determined by means of the developed two-fingered micro hand and an atomic force microscope (AFM). The micro hand has excellent absolute positioning accuracy after the elaborated calibration, and is typically capable of obtaining less than several hundred nanometer of positioning accuracy by human teleoperation. The authors also developed an AFM system of our own composition. The AFM consists of a laser diode module, a cantilever, a 4-segment photodiode and output circuit. The task to measure the mechanical properties of cells include moving of the fingers from the home position to the target object(cell), then picking and grasping it, moving it to a target position(AFM tip), and finally pushing it against the cantilever tip. However, since it is difficult to stabilize the sample, the authors utilized the capillary phenomenon, i.e. the liquid inside the tube-shaped object ascends the inner wall in order to stabilize the sample strongly. And force-indentation relation were obtained applying a force to individual yeast cells by moving the sample to the cantilever tip. Force is automatically calculated from the cantilever deflection measured with a lazer beam and a quadrature photodiode, while indentation is obtained from the difference between the movement of the micro hand and that of the cantilever tip caused by cantilever deflection. The mechanical properties of yeast cells is finally determined using the produced force-indentation curves, the Hertz model and FIEL(force indentation to equal limits) mapping, which is an analytical way for determinating relative microelastic properties from force volumes of viscoelastic materials.
KW - Atomic force microscope
KW - Mechanical properties
KW - Two-fingered micro hand
KW - Yeast cell
UR - http://www.scopus.com/inward/record.url?scp=62449315754&partnerID=8YFLogxK
U2 - 10.1109/IROS.2005.1545140
DO - 10.1109/IROS.2005.1545140
M3 - Conference contribution
AN - SCOPUS:62449315754
SN - 0780389123
SN - 9780780389120
T3 - 2005 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS
SP - 990
EP - 995
BT - 2005 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS
PB - IEEE Computer Society
ER -