TY - JOUR
T1 - Laser differential fitting confocal microscopy with high imaging efficiency
AU - Sheng, Zhong
AU - Wang, Yun
AU - Zhao, Weiqian
AU - Qiu, Lirong
AU - Sun, Yingbin
N1 - Publisher Copyright:
© 2016 Optical Society of America.
PY - 2016/9/1
Y1 - 2016/9/1
N2 - Based on the optical arrangement of a bipolar differential confocal microscopy (BDCM), laser differential fitting confocal microscopy (DFCM) is proposed in this paper using the feature of BDCM that a zero-crossing point (ZCP) of the axial response curve precisely corresponds to the focus of the system objective. A linear segment of the DFCM axial response around the ZCP is used to fit a straight line. Focus can be determined by solving the equations of the fitting lines, and then, the sample surface could be measured and reconstructed with a high resolution. Compared with the curve-fitting peak detection, which is an algorithm for focus detection widely used in conventional confocal microscopy, the line-fitting zero solution method used in DFCM has several advantages, such as high precision and sensitivity. Most importantly, precise focus detection can be realized using less data, i.e., DFCM has a high measurement efficiency. Furthermore, DFCM can effectively eliminate common-mode noise in a confocal microscopy system and has good noise suppression and disturbance resistance capability.
AB - Based on the optical arrangement of a bipolar differential confocal microscopy (BDCM), laser differential fitting confocal microscopy (DFCM) is proposed in this paper using the feature of BDCM that a zero-crossing point (ZCP) of the axial response curve precisely corresponds to the focus of the system objective. A linear segment of the DFCM axial response around the ZCP is used to fit a straight line. Focus can be determined by solving the equations of the fitting lines, and then, the sample surface could be measured and reconstructed with a high resolution. Compared with the curve-fitting peak detection, which is an algorithm for focus detection widely used in conventional confocal microscopy, the line-fitting zero solution method used in DFCM has several advantages, such as high precision and sensitivity. Most importantly, precise focus detection can be realized using less data, i.e., DFCM has a high measurement efficiency. Furthermore, DFCM can effectively eliminate common-mode noise in a confocal microscopy system and has good noise suppression and disturbance resistance capability.
UR - http://www.scopus.com/inward/record.url?scp=84987667587&partnerID=8YFLogxK
U2 - 10.1364/AO.55.006903
DO - 10.1364/AO.55.006903
M3 - Article
AN - SCOPUS:84987667587
SN - 1559-128X
VL - 55
SP - 6903
EP - 6909
JO - Applied Optics
JF - Applied Optics
IS - 25
ER -