Abstract
The initial surface reaction mechanisms of atomic layer deposition TiO2 on H/Si(100)-2×1 surface using Ti(OCH3)4 and H2O as precursors are investigated by density functional theory. The ALD process is divided into two half-reactions, i.e., Ti(OCH3)4 and H2O half-reactions. The adsorption energy of Ti(OCH3)4 on H/Si(100)-2×1 surface is only -2.4 kJ/mol. The overall reaction of Ti(OCH3)4 is exothermic, which indicates that Ti(OCH3)4 half-reactions are favorable on thermodynamic. Howerver, H2O half-reactions are endothermic and thermodynamically unfavorable.
Original language | English |
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Title of host publication | Advanced Engineering Materials III |
Pages | 1052-1056 |
Number of pages | 5 |
DOIs | |
Publication status | Published - 2013 |
Event | 3rd International Conference on Advanced Engineering Materials and Technology, AEMT 2013 - Zhangjiajie, China Duration: 11 May 2013 → 12 May 2013 |
Publication series
Name | Advanced Materials Research |
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Volume | 750-752 |
ISSN (Print) | 1022-6680 |
Conference
Conference | 3rd International Conference on Advanced Engineering Materials and Technology, AEMT 2013 |
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Country/Territory | China |
City | Zhangjiajie |
Period | 11/05/13 → 12/05/13 |
Keywords
- Atomic layer deposition
- Density functional theory
- Titanium dioxide
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Zhou, G. F., Ren, J., & Zhang, S. W. (2013). Initial surface reactions mechanisms of atomic layer deposition TiO2 on H/Si(100)-2×1 surface. In Advanced Engineering Materials III (pp. 1052-1056). (Advanced Materials Research; Vol. 750-752). https://doi.org/10.4028/www.scientific.net/AMR.750-752.1052