Initial surface reactions mechanisms of atomic layer deposition TiO2 on H/Si(100)-2×1 surface

Guang Fen Zhou, Jie Ren, Shao Wen Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

The initial surface reaction mechanisms of atomic layer deposition TiO2 on H/Si(100)-2×1 surface using Ti(OCH3)4 and H2O as precursors are investigated by density functional theory. The ALD process is divided into two half-reactions, i.e., Ti(OCH3)4 and H2O half-reactions. The adsorption energy of Ti(OCH3)4 on H/Si(100)-2×1 surface is only -2.4 kJ/mol. The overall reaction of Ti(OCH3)4 is exothermic, which indicates that Ti(OCH3)4 half-reactions are favorable on thermodynamic. Howerver, H2O half-reactions are endothermic and thermodynamically unfavorable.

Original languageEnglish
Title of host publicationAdvanced Engineering Materials III
Pages1052-1056
Number of pages5
DOIs
Publication statusPublished - 2013
Event3rd International Conference on Advanced Engineering Materials and Technology, AEMT 2013 - Zhangjiajie, China
Duration: 11 May 201312 May 2013

Publication series

NameAdvanced Materials Research
Volume750-752
ISSN (Print)1022-6680

Conference

Conference3rd International Conference on Advanced Engineering Materials and Technology, AEMT 2013
Country/TerritoryChina
CityZhangjiajie
Period11/05/1312/05/13

Keywords

  • Atomic layer deposition
  • Density functional theory
  • Titanium dioxide

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