TY - JOUR
T1 - Growth mechanism of hydrogenated amorphous carbon films
T2 - Molecular dynamics simulations
AU - Chen, Yi Nan
AU - Ma, Tian Bao
AU - Zhu, Peng Zhe
AU - Yue, Da Chuan
AU - Hu, Yuan Zhong
AU - Chen, Zhe
AU - Wang, Hui
N1 - Publisher Copyright:
© 2014 Elsevier B.V.
PY - 2014/11/15
Y1 - 2014/11/15
N2 - The microstructure and growth mechanism of hydrogenated amorphous carbon films, deposited from different hydrocarbon sources and at various incident energies, are investigated by molecular dynamics (MD) simulations. At low energies, molecular adsorption dominates the process of the film growth, so the incident molecules tend to preserve their original molecular structures. As the incident energy rises, film density increases firstly and then becomes stabilized, while hydrogen content decreases because of molecular fragmentation and the increase in sputtering yield of hydrogen atoms. Hydrogen atoms play an important role in the growth of hydrogenated amorphous carbon films. The formation of sp3 structures at low energies, for example, mainly attributes to the hydrogen adsorption and the formation of C-H bonds; while at high energies the subplantation of carbon atoms and formation of C-C bonds are most responsible to the formation of sp3 structures. An increase of hydrogen content in source gas could lead to lower film density, higher hydrogen content in film and a general increase of sp3 fraction. The existence of dangling bonds in incident radicals facilitates easier adsorption than neutral molecules at low energies, resulting in higher deposition yield and sp3 fraction. This trend, however, diminishes at high energies when extensive molecular fragmentation occurs.
AB - The microstructure and growth mechanism of hydrogenated amorphous carbon films, deposited from different hydrocarbon sources and at various incident energies, are investigated by molecular dynamics (MD) simulations. At low energies, molecular adsorption dominates the process of the film growth, so the incident molecules tend to preserve their original molecular structures. As the incident energy rises, film density increases firstly and then becomes stabilized, while hydrogen content decreases because of molecular fragmentation and the increase in sputtering yield of hydrogen atoms. Hydrogen atoms play an important role in the growth of hydrogenated amorphous carbon films. The formation of sp3 structures at low energies, for example, mainly attributes to the hydrogen adsorption and the formation of C-H bonds; while at high energies the subplantation of carbon atoms and formation of C-C bonds are most responsible to the formation of sp3 structures. An increase of hydrogen content in source gas could lead to lower film density, higher hydrogen content in film and a general increase of sp3 fraction. The existence of dangling bonds in incident radicals facilitates easier adsorption than neutral molecules at low energies, resulting in higher deposition yield and sp3 fraction. This trend, however, diminishes at high energies when extensive molecular fragmentation occurs.
KW - Film growth
KW - Hydrogen content
KW - Hydrogenated amorphous carbon film
KW - Molecular dynamics simulation
KW - Sp fraction
UR - http://www.scopus.com/inward/record.url?scp=84912534000&partnerID=8YFLogxK
U2 - 10.1016/j.surfcoat.2014.07.061
DO - 10.1016/j.surfcoat.2014.07.061
M3 - Article
AN - SCOPUS:84912534000
SN - 0257-8972
VL - 258
SP - 901
JO - Surface and Coatings Technology
JF - Surface and Coatings Technology
ER -