Fast diagnosis of transient plasma by Langmuir probe

En Ling Tang*, Qing Ming Zhang, Ji Ting Ouyang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

A method for the fast measurement of electron temperature and density with temporal resolution in transient plasma has been implemented by Langmuir probe. The diagnostic system consists of a single Langmuir probe driven by a high frequency sinusoidal voltage. The current and voltage spectrum on the probe were detected synchronously by an oscilloscope with sampling rate being at least 5 times higher than the frequency of sweep voltage. The system has been used to diagnose the transient plasma generated by hypervelocity-impact of LY12 aluminum projectile into LY12 aluminum target.

Original languageEnglish
Pages (from-to)375-378
Number of pages4
JournalJournal of Beijing Institute of Technology (English Edition)
Volume16
Issue number3
Publication statusPublished - Sept 2007

Keywords

  • Langmuir probe
  • Plasma diagnosis
  • Sweep voltage
  • Transient plasma

Fingerprint

Dive into the research topics of 'Fast diagnosis of transient plasma by Langmuir probe'. Together they form a unique fingerprint.

Cite this