@inproceedings{9b30186527954594adca58730eb9079a,
title = "Experimental research on radius of curvature measurement of spherical lenses based on laser differential confocal technique",
abstract = "A new approach based on laser differential confocal technique is potential to achieve high accuracy in radius of curvature (ROC) measurement. It utilizes two digital microscopes with virtual pinholes on the CCD detectors to precisely locate the cat's-eye and the confocal positions, which can enhance the focus-identification resolution. An instrumental system was established and experimental research was carried out to determine how error sources contribute to the uncertainty of ROC measurement, such as optical axis misalignment, dead path of the interferometer, surface figure error of tested lenses and temperature fluctuation, etc. Suggestions were also proposed on how these factors could be avoided or suppressed. The system performance was tested by employing four pairs of template lenses with a serial of ROC values. The relative expanded uncertainty was analyzed and calculated based on theoretical analysis and experimental determination, which was smaller than 2×10 -5 (k=2). The results were supported by comparison measurement between the differential confocal radius measurement (DCRM) system and an ultra-high accuracy three-dimensional profilometer, showing good consistency. It demonstrated that the DCRM system was capable of high-accuracy ROC measurement.",
keywords = "error sources, laser differential confocal technique, radius of curvature, uncertainty, virtual pinhole",
author = "Xiang Ding and Ruoduan Sun and Fei Li and Weiqian Zhao and Wenli Liu",
year = "2011",
doi = "10.1117/12.906384",
language = "English",
isbn = "9780819488428",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
booktitle = "2011 International Conference on Optical Instruments and Technology",
address = "United States",
note = "2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ; Conference date: 06-11-2011 Through 09-11-2011",
}