Effective cycle slip detection and repair for PPP/INS integrated systems

Sheng Yang, Leilei Li*, Jingbin Liu, Qusen Chen, Xuewen Ding, Hongxing Sun, Yu Wu, Chunhua Ren, Ning Hu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

Cycle slip (CS) is a primary error source in Precise Point Positioning/Inertial Navigation System (PPP/INS) integrated systems. In this study, an INS-aided CS detection and repair method is presented. It utilizes high-precision INS information instead of a pseudorange to remove the satellite–receiver geometric range in the wide-lane (WL) and ionospheric-free (IF) phase combinations and creates an INS-aided WL (WL-INS) model and an INS-aided IF (IF-INS) model. Since INS information is superior to pseudorange, the INS-aided models have high detection accuracy. However, the effectiveness of INS-aided models cannot persist for a long time because of INS accumulation error. To overcome the disturbance of INS error, improved INS-aided models are proposed. This idea takes advantage of the long wavelength of WL combination and tries to fix WL CS. Once it succeeds, the INS error can be evaluated and removed. The proposed method was tested using land vehicle data, in which simulated cycle slips and signal interruption were introduced. The results show that this method can accurately detect and repair different cycle slips between the continuous Global Positioning System (GPS) epoch. When it comes to the cycle slip after a GPS interruption, the method can also accelerate PPP re-convergence, as it is not affected by the inertial accumulation error.

Original languageEnglish
Article number502
JournalSensors
Volume19
Issue number3
DOIs
Publication statusPublished - 1 Feb 2019
Externally publishedYes

Keywords

  • Cycle slip
  • Detection and repair
  • INS
  • PPP

Fingerprint

Dive into the research topics of 'Effective cycle slip detection and repair for PPP/INS integrated systems'. Together they form a unique fingerprint.

Cite this