TY - GEN
T1 - Beam shaping for detection of small object by Phase Correction Element
AU - Yamada, Masato
AU - Arai, Tatsuo
AU - Matsumura, Yoshiyuki
AU - Kanou, Yasuyuki
PY - 2008
Y1 - 2008
N2 - The spot size is determined by the wavelength of the laser and the numerical aperture (NA) of the objective lens. So it cannot be below the diffraction limit. There is, however, a method of increasing the resolution of an ideal optical system by varying the state of the laser light that enters the objective lens. This is a kind of super-resolution. That method, however, generates side-lobes, which are a characteristic of super-resolution. We report a method of eliminating the effects of side lobes through beam shaping. We evaluated the data reading characteristic for when the phase correction element was applied to an optical disk.
AB - The spot size is determined by the wavelength of the laser and the numerical aperture (NA) of the objective lens. So it cannot be below the diffraction limit. There is, however, a method of increasing the resolution of an ideal optical system by varying the state of the laser light that enters the objective lens. This is a kind of super-resolution. That method, however, generates side-lobes, which are a characteristic of super-resolution. We report a method of eliminating the effects of side lobes through beam shaping. We evaluated the data reading characteristic for when the phase correction element was applied to an optical disk.
KW - Beam shaping
KW - Optical disk
KW - Phase correction element
UR - http://www.scopus.com/inward/record.url?scp=56749151277&partnerID=8YFLogxK
U2 - 10.1109/SICE.2008.4655026
DO - 10.1109/SICE.2008.4655026
M3 - Conference contribution
AN - SCOPUS:56749151277
SN - 9784907764296
T3 - Proceedings of the SICE Annual Conference
SP - 2188
EP - 2191
BT - Proceedings of SICE Annual Conference 2008 - International Conference on Instrumentation, Control and Information Technology
T2 - SICE Annual Conference 2008 - International Conference on Instrumentation, Control and Information Technology
Y2 - 20 August 2008 through 22 August 2008
ER -