Argon Plasma Induced Phase Transition in Monolayer MoS2

Jianqi Zhu, Zhichang Wang, Hua Yu, Na Li, Jing Zhang, Jianling Meng, Mengzhou Liao, Jing Zhao, Xiaobo Lu, Luojun Du, Rong Yang, Dongxia Shi, Ying Jiang*, Guangyu Zhang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

354 Citations (Scopus)

Abstract

In this work, we report a facile, clean, controllable and scalable phase engineering technique for monolayer MoS2. We found that weak Ar-plasma bombardment can locally induce 2H→1T phase transition in monolayer MoS2 to form mosaic structures. These 2H→1T phase transitions are stabilized by point defects (single S-vacancies) and the sizes of induced 1T domains are typically a few nanometers, as revealed by scanning tunneling microscopy measurements. On the basis of a selected-area phase patterning process, we fabricated MoS2 FETs inducing 1T phase transition within the metal contact areas, which exhibit substantially improved device performances. Our results open up a new route for phase engineering in monolayer MoS2 and other transition metal dichalcogenide (TMD) materials.

Original languageEnglish
Pages (from-to)10216-10219
Number of pages4
JournalJournal of the American Chemical Society
Volume139
Issue number30
DOIs
Publication statusPublished - 2 Aug 2017
Externally publishedYes

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