Application of a revised scanning splice method for the Mueller microscope

The resolution and the field-of-view (FOV) of the Mueller microscope are mutually limiting. The increasing magnification exponentially reduces the FOV of microscopic images, which hinders the acquisition of high-resolution Mueller polarization images with large FOV. To address this problem, we propose a scanning splice method for the Mueller microscope. In this method, an optimized image stitching arithmetic, which specially restricts the selection of feature points to ensure the consistency of stitching results of multiple groups of images with the same position and different polarization states, is combined with Mueller polarization detection techniques. In addition, the combination involved can correct the slight jitter error of the system caused by the rotation of the wave plate during Mueller polarization detection. The experiment results demonstrate that this optimized arithmetic is more accurate than the traditional image stitching arithmetic. This research provides the possibility of the development of the whole slide scanning Mueller microscope.