A New Compound Negative Binomial Distribution and Its Applications in Reliability

Xiaoyue Wang, Xian Zhao*, Jinglei Sun

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    A new negative binomial distribution (NBS) is proposed by introducing the concept of sparse connection. Finite Markov chain imbedding approach is used to obtain NBS for the cases of independent trials, first-order Markov dependent trials and high-order Markov dependent trials respectively. New compound negative binomial distributions called CNBS and CMNBS for independent and Markov cases respectively are derived by means of phase-type representations. The new compound negative binomial distributions can be applied in the shock models and start-up demonstration tests in the field of reliability. Numerical examples based on shock models are then presented to demonstrate the applicability of the new distribution.

    Original languageEnglish
    Title of host publication2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781728171029
    DOIs
    Publication statusPublished - Aug 2020
    Event2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020 - Vancouver, Canada
    Duration: 20 Aug 202023 Aug 2020

    Publication series

    Name2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020

    Conference

    Conference2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020
    Country/TerritoryCanada
    CityVancouver
    Period20/08/2023/08/20

    Keywords

    • Compound random variable
    • Finite Markov chain imbedding approach
    • Phase-type distribution
    • Sparse connection

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