跳到主要导航 跳到搜索 跳到主要内容

Wafer Lot Assignment for Parallel-Producing Tools Based on Heuristic Clustering Algorithm

  • Fuzuo Zhang
  • , Qinghua Tao
  • , Yuanyuan Yan
  • , Xin Li
  • , Fuquan Zhang
  • , Ying Gao
  • , Bing Yang
  • , Huangang Wang*
  • *此作品的通讯作者
  • Tsinghua University
  • Semiconductor Technology Innovation Center (Beijing) Corporation

科研成果: 期刊稿件文章同行评审

摘要

Beyond the widely-studied scheduling of wafers within cluster tools, a novel and important perspective is raised in this paper to tackle an upper-level optimization problem in real-world production, i.e., the assignment of hybrid types of wafer lots to a set of cluster tools with parallel modules to minimize the maximum completion time for the lots. The main difficulty in addressing such a problem is that the objective, i.e., the maximum completion time, cannot be calculated explicitly beforehand. To make this problem tractable, the associated maximal overlap among tools is utilized to heuristically evaluate the objective for the problem. Besides, since the cluster tools for processing are identical, we further tackle this problem as a clustering issue. Accordingly, a clustering algorithm based on greedy searching is proposed to allocate wafer lots into cluster tools while minimizing the maximal overlap. To elucidate our method and its significance in real-world production, the wet bench tool in wet cleaning process is taken as a case study. We compare the proposed algorithm with the empirical method in fabs and several intelligent optimization algorithms, and the experimental results verify the effectiveness of our proposed method in terms of improved efficiency.

源语言英语
页(从-至)300-308
页数9
期刊IEEE Transactions on Semiconductor Manufacturing
35
2
DOI
出版状态已出版 - 1 5月 2022
已对外发布

指纹

探究 'Wafer Lot Assignment for Parallel-Producing Tools Based on Heuristic Clustering Algorithm' 的科研主题。它们共同构成独一无二的指纹。

引用此