TY - JOUR
T1 - Timing-Skew Calibration Techniques in Time-Interleaved ADCs
AU - Gu, Mingyang
AU - Tao, Yunsong
AU - Zhong, Yi
AU - Jie, Lu
AU - Sun, Nan
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2025
Y1 - 2025
N2 - Time-interleaved (TI) analog-to-digital converters (ADCs) are a widely used architecture in high-speed ADCs. With the growing demand for higher sampling rates, time interleaving plays an increasingly important role. However, imperfections introduced by time interleaving, particularly timing skew, significantly limit the ADC performance. This article presents a comprehensive review of timing skew and its calibration techniques in TI ADCs. It covers the fundamentals of time interleaving, the principle of timing skew, and general considerations of timing-skew calibration. Moreover, it categorizes existing calibration techniques into three types: 1) autocorrelation-based; 2) reference-channel-based; and 3) reference-signal-based, and provides detailed analyses.
AB - Time-interleaved (TI) analog-to-digital converters (ADCs) are a widely used architecture in high-speed ADCs. With the growing demand for higher sampling rates, time interleaving plays an increasingly important role. However, imperfections introduced by time interleaving, particularly timing skew, significantly limit the ADC performance. This article presents a comprehensive review of timing skew and its calibration techniques in TI ADCs. It covers the fundamentals of time interleaving, the principle of timing skew, and general considerations of timing-skew calibration. Moreover, it categorizes existing calibration techniques into three types: 1) autocorrelation-based; 2) reference-channel-based; and 3) reference-signal-based, and provides detailed analyses.
KW - Analog-to-digital converter (ADC)
KW - calibration
KW - time-interleaved (TI) ADC
KW - timing skew
KW - timing-skew calibration
UR - https://www.scopus.com/pages/publications/85212580222
U2 - 10.1109/OJSSCS.2024.3519486
DO - 10.1109/OJSSCS.2024.3519486
M3 - Article
AN - SCOPUS:85212580222
SN - 2644-1349
VL - 5
SP - 1
EP - 10
JO - IEEE Open Journal of the Solid-State Circuits Society
JF - IEEE Open Journal of the Solid-State Circuits Society
ER -