The influence of laser spot size on the micro-Doppler spectrum

Dehua Zhang, Haiyang Zhang*, Zheng Zheng, Hongzhi Yang, Changming Zhao, Suhui Yang

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

2 引用 (Scopus)

摘要

Micro-Doppler effect, which is induced by micro motion of target or any structure on the target, is a frequency modulation that generates sidebands about the target's Doppler frequency shift, such as mechanical vibration or rotation. When a target's motions incorporate micro motions, the radar echo signal will contain micro-Doppler characteristics related to these motions. Therefore, the micro-Doppler effect provides a new approach to obtain the dynamic properties of targets, which can be used to accomplish the detection and identification of targets, such as the identification of different types of helicopters. Scattering of the laser spot from a target surface modulates the Doppler signal, causes broadening of the signal spectrum, and, adds uncertainty to the signature analysis. A mathematic model of cone spin, which is a typical micro motion, is built first in this paper. Furthermore, an analyzed equation is deduced to predict the micro-Doppler spectral broadening of acquired medium current signals in situations of different laser spot size. It is found that the beam spot size on the target affects the resulting spectral broadening. Finally, an experiment based on the scaled model is performed to verify the simulation. A narrow-linewidth single frequency fiber laser is employed to detect the cone target at different laser spot size by coherent detection with constant detect distance and laser power. The experimental result shows that the beam spot size on the target affects the resulting spectral broadening caused by speckle, which corresponds to the simulation result. The experimental broadening was consistently greater than the theoretical broadening due to other effects that also contribute to the total broadening.

源语言英语
主期刊名2015 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems, OIT 2015
编辑Kexin Xu, Hai Xiao, Jigui Zhu, Hwa-Yaw Tam, Sen Han
出版商SPIE
ISBN(电子版)9781628418040
DOI
出版状态已出版 - 2015
活动2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, OIT 2015 - Beijing, 中国
期限: 17 5月 201519 5月 2015

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
9623
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, OIT 2015
国家/地区中国
Beijing
时期17/05/1519/05/15

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