The focusing action of refractive microlens by rigorous method

Juan Liu; Ben Yuan Gu; Bi Zhen Dong; Guo Zhen Yang

doi:10.1117/12.612490

The focusing action of refractive microlens by rigorous method

Juan Liu^*
, Ben Yuan Gu
, Bi Zhen Dong
, Guo Zhen Yang

^*此作品的通讯作者

Beijing Jiaotong University
CAS - Institute of Physics

科研成果: 期刊稿件 › 会议文章 › 同行评审

摘要

We investigate the focusing action of refractive microlens based on the rigorous electromagnetic theory by boundary element method. We numerically simulate total electric-field patterns, the electric-field intensity distributions on the focal plane, and their diffractive efficiencies at the focal spots for describing the focusing behaviours of these microlenses with continuous and multilevel surface-envelopes. Focusing action of incident beam with a certain angle of inclination is indagated as well. The present numerical and graphical results may provide an useful information for the analysis and the design of refractive elements in micro-optics.

源语言	英语
期刊论文编号	81
页（从-至）	210-220
页数	11
期刊	Proceedings of SPIE - The International Society for Optical Engineering
卷	5856 PART I
DOI	https://doi.org/10.1117/12.612490
出版状态	已出版 - 2005
已对外发布	是
活动	Optical Measurement Systems for Industrial Inspection IV - Munich, 德国期限: 13 6月 2005 → 17 6月 2005

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title = "The focusing action of refractive microlens by rigorous method",

abstract = "We investigate the focusing action of refractive microlens based on the rigorous electromagnetic theory by boundary element method. We numerically simulate total electric-field patterns, the electric-field intensity distributions on the focal plane, and their diffractive efficiencies at the focal spots for describing the focusing behaviours of these microlenses with continuous and multilevel surface-envelopes. Focusing action of incident beam with a certain angle of inclination is indagated as well. The present numerical and graphical results may provide an useful information for the analysis and the design of refractive elements in micro-optics.",

keywords = "Boundary element method, Focusing action, Refractive microlens",

author = "Juan Liu and Gu, \{Ben Yuan\} and Dong, \{Bi Zhen\} and Yang, \{Guo Zhen\}",

year = "2005",

doi = "10.1117/12.612490",

language = "English",

volume = "5856 PART I",

pages = "210--220",

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note = "Optical Measurement Systems for Industrial Inspection IV ; Conference date: 13-06-2005 Through 17-06-2005",

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TY - JOUR

T1 - The focusing action of refractive microlens by rigorous method

AU - Liu, Juan

AU - Gu, Ben Yuan

AU - Dong, Bi Zhen

AU - Yang, Guo Zhen

PY - 2005

Y1 - 2005

N2 - We investigate the focusing action of refractive microlens based on the rigorous electromagnetic theory by boundary element method. We numerically simulate total electric-field patterns, the electric-field intensity distributions on the focal plane, and their diffractive efficiencies at the focal spots for describing the focusing behaviours of these microlenses with continuous and multilevel surface-envelopes. Focusing action of incident beam with a certain angle of inclination is indagated as well. The present numerical and graphical results may provide an useful information for the analysis and the design of refractive elements in micro-optics.

AB - We investigate the focusing action of refractive microlens based on the rigorous electromagnetic theory by boundary element method. We numerically simulate total electric-field patterns, the electric-field intensity distributions on the focal plane, and their diffractive efficiencies at the focal spots for describing the focusing behaviours of these microlenses with continuous and multilevel surface-envelopes. Focusing action of incident beam with a certain angle of inclination is indagated as well. The present numerical and graphical results may provide an useful information for the analysis and the design of refractive elements in micro-optics.

KW - Boundary element method

KW - Focusing action

KW - Refractive microlens

UR - https://www.scopus.com/pages/publications/28844496721

U2 - 10.1117/12.612490

DO - 10.1117/12.612490

M3 - Conference article

AN - SCOPUS:28844496721

SN - 0277-786X

VL - 5856 PART I

SP - 210

EP - 220

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

M1 - 81

T2 - Optical Measurement Systems for Industrial Inspection IV

Y2 - 13 June 2005 through 17 June 2005

ER -

The focusing action of refractive microlens by rigorous method

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