The data acquisition system based on xPC target environment

Min Wang; Chang Le Xiang; Yue Ma

The data acquisition system based on xPC target environment

Min Wang^*
, Chang Le Xiang
, Yue Ma

^*此作品的通讯作者

机械与车辆学院

Beijing Institute of Technology

科研成果: 期刊稿件 › 文章 › 同行评审

2 引用（Scopus）

摘要

A real-time DAS is developed based on the basic discussion on RTW and xPC target with PCL1800-a high-frequency I/O board made by Advantech. The DAS is easy to develop, maintain and extend in short time. It supports the on-line parameter regulation with real-time display.

源语言	英语
页（从-至）	228-231
页数	4
期刊	Journal of Test and Measurement Technology
卷	18
期	3
出版状态	已出版 - 2004

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title = "The data acquisition system based on xPC target environment",

abstract = "A real-time DAS is developed based on the basic discussion on RTW and xPC target with PCL1800-a high-frequency I/O board made by Advantech. The DAS is easy to develop, maintain and extend in short time. It supports the on-line parameter regulation with real-time display.",

keywords = "PCL1800, RTW, Real-time DAS, xPC target",

author = "Min Wang and Xiang, \{Chang Le\} and Yue Ma",

year = "2004",

language = "English",

volume = "18",

pages = "228--231",

journal = "Journal of Test and Measurement Technology",

issn = "1671-7449",

publisher = "Publishing Department of North University of China",

number = "3",

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TY - JOUR

T1 - The data acquisition system based on xPC target environment

AU - Wang, Min

AU - Xiang, Chang Le

AU - Ma, Yue

PY - 2004

Y1 - 2004

N2 - A real-time DAS is developed based on the basic discussion on RTW and xPC target with PCL1800-a high-frequency I/O board made by Advantech. The DAS is easy to develop, maintain and extend in short time. It supports the on-line parameter regulation with real-time display.

AB - A real-time DAS is developed based on the basic discussion on RTW and xPC target with PCL1800-a high-frequency I/O board made by Advantech. The DAS is easy to develop, maintain and extend in short time. It supports the on-line parameter regulation with real-time display.

KW - PCL1800

KW - RTW

KW - Real-time DAS

KW - xPC target

UR - https://www.scopus.com/pages/publications/4644340551

M3 - Article

AN - SCOPUS:4644340551

SN - 1671-7449

VL - 18

SP - 228

EP - 231

JO - Journal of Test and Measurement Technology

JF - Journal of Test and Measurement Technology

IS - 3

ER -

The data acquisition system based on xPC target environment

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