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Test Method for High-Power Microwave Irradiation Effects in Millimeter-Wave Proximity Detector

  • Cao Yuxi
  • , Cao Ronggang*
  • , Zhang Anqi
  • , Yu Yongbin
  • , Li Changcheng
  • , Tang Mingyu
  • *此作品的通讯作者
  • Beijing Institute of Technology

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

High-Power Microwave (HPM) is an emerging technology formed by the development of electrotechnology, traditional microwave, plasma physics, and other related fields, which has very important applications in the military field. With the formal entry of the HPM weapon into the battlefield, it is of great practical significance to study the HPM effects in susceptible electronic systems such as the detector. To objectively evaluate the ability of a certain type of millimeter-wave proximity detector to resist HPM electromagnetic pulse jamming, an HPM irradiation system for the proximity detector was constructed, and a method of real-time storage of proximity detector output potentials using a compact online recording device has been provided. Based on that, the paper carries out the HPM irradiation test of the K-band proximity detector and enriches the means of irradiation effect data recording for small electronic devices.

源语言英语
主期刊名2024 6th International Conference on Power and Energy Technology, ICPET 2024
出版商Institute of Electrical and Electronics Engineers Inc.
217-221
页数5
ISBN(电子版)9798350375855
DOI
出版状态已出版 - 2024
活动6th International Conference on Power and Energy Technology, ICPET 2024 - Beijing, 中国
期限: 12 7月 202415 7月 2024

出版系列

姓名2024 6th International Conference on Power and Energy Technology, ICPET 2024

会议

会议6th International Conference on Power and Energy Technology, ICPET 2024
国家/地区中国
Beijing
时期12/07/2415/07/24

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