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Study on the stitching interferometry for the surface profile measurement of a large aperture component

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The stitching interferometry for the surface profile measurement of a large aperture component is studied. To analyze the overlapping region interferogram of the adjacent subapertures with Scale Invariant Feature Transform(SIFT) algorithm, the stitching parameters of the adjacent subapertures and then overall surface information of the tested component can be obtained. SIFT algorithm of subaperture positioning, interferogram processing, phase unwrapping, Zernike polynomials wavefront fitting and subaperture wavefront stitching programs are written. A principle experiment has been carried out. Compared with the measurement results between the stitching interferometry and full caliber testing, the deviation of RMS is less than 2nm.

源语言英语
主期刊名Dimensional Optical Metrology and Inspection for Practical Applications III
出版商SPIE
ISBN(印刷版)9781628410471
DOI
出版状态已出版 - 2014
已对外发布
活动Dimensional Optical Metrology and Inspection for Practical Applications III - Baltimore, MD, 美国
期限: 5 5月 20146 5月 2014

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
9110
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Dimensional Optical Metrology and Inspection for Practical Applications III
国家/地区美国
Baltimore, MD
时期5/05/146/05/14

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