Study on high-temperature transformation and dielectric properties of silicon resin/silicon dioxide composite

Silicon dioxide based composite with a few silicon resin was ablated quickly by oxyacetylene spraying gun, and was characterized by x-ray diffraction, electron microscope and selective area electron diffraction. It was found that there are a few α-cristobalite crystallization and α-silicon carbide, β-silicon carbide formation. Based on experiments above, the relationship between physical and chemical states transformation of materials and high-temperature dielectric properties was studied.