摘要
Intelligent Magnetic Detection Microsystems (IMDM) are complex microsystems, which are used to obtain the information of motor flux and speed in single-driveway traffic system; the microsystems have to fulfill the task in a harsh environment of field, which would infect the reliability of system. An effective method to ensure maintenance cost and reliability is to integrate efficient built-in-test and monitoring function into IMDM, so testability analysis is introduced in the design of Microsystems. The Microsystems testing-points and diagnostic strategy are reasonably identified, which are beneficial to implement the rapid detection and fault isolation. This paper presents an approach to construct a fault message matrix based on the functional block diagram and signal flow chart of the microsystems. By analyzing the contribution of the testing-points to fault detection and fault isolation, the matrix is resolved step by step, the most necessary testing-points are identified and optimal diagnostic strategy is determined. Thus, the purpose of fault detection and fault isolation is achieved by the use of the fewest testing-points and short time.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 89-94 |
| 页数 | 6 |
| 期刊 | Microsystem Technologies |
| 卷 | 15 |
| 期 | 1 SPEC. ISS. |
| DOI | |
| 出版状态 | 已出版 - 1月 2009 |
| 已对外发布 | 是 |
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