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Study of temperature and field dependence of ferroelectric thin films at microwave frequencies

  • Qingduan Meng*
  • , Xueqiang Zhang
  • , Fei Li
  • , Jiandong Huang
  • , Xiaohong Zhu
  • , Dongning Zheng
  • , Yusheng He
  • , Qiang Luo
  • , Changzhi Gu
  • *此作品的通讯作者
  • CAS - Institute of Physics

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Ferroelectric thin films (e.g. Ba0.5Sr0.5TiO 3) require systematic studies of their dielectric properties at microwave frequencies. We propose a new method employing comparisons between the measured and the simulated microwave responses of a coplanar waveguide (CPW) bandstop filter, which is made of the thin film to be studied. The temperature and field dependence of the dielectric constant and loss tangent of the ferroelectric thin film are then deduced from the systematic comparison studies. Attention is also paid to the effect of the temperature dependent conductivity of the conducting layer of the filter, which has a noticeable effect on both the resonant frequency and the Q value of the filter. For an accurate determination of the dielectric constant and loss tangent of the ferroelectric thin film, such effect should be carefully analyzed and eliminated.

源语言英语
主期刊名LOW TEMPERATURE PHYSICS
主期刊副标题24th International Conference on Low Temperature Physics - LT24
1669-1670
页数2
DOI
出版状态已出版 - 2006
已对外发布
活动LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24 - Orlando, FL, 美国
期限: 10 8月 200617 10月 2006

丛书

姓名AIP Conference Proceedings
850
ISSN(印刷版)0094-243X
ISSN(电子版)1551-7616

会议

会议LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24
国家/地区美国
Orlando, FL
时期10/08/0617/10/06

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