摘要
Researchers report fabricating a superconductor-topological insulator-normal metal heterostructure with a layered configuration of HfTe3/HfTe5/Hf for the first time. By optimizing the experimental process, they find that this heterostructure can indeed form spontaneously. The atomic structure of the heterostructure has been determined by in situ scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). Scanning tunneling spectroscopy (STS) measurements directly reveal a bandgap as large as 60 meV in HfTe5 film and a superconducting spectrum in HfTe3/HfTe5.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 5013-5017 |
| 页数 | 5 |
| 期刊 | Advanced Materials |
| 卷 | 28 |
| 期 | 25 |
| DOI | |
| 出版状态 | 已出版 - 7月 2016 |
| 已对外发布 | 是 |
学术指纹
探究 'Spontaneous Formation of a Superconductor–Topological Insulator–Normal Metal Layered Heterostructure' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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