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Solid-State Beam Scanner Based on VCSEL Integrated Amplifier with Scan Resolution of over 200

  • Shanting Hu
  • , Masashi Takanohashi
  • , Xiaodong Gu
  • , Keisuke Shimura
  • , Fumio Koyama
  • Tokyo Institute of Technology

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

We demonstrate a solid-state beam scanner based on VC SEL-integrated amplifier for 3D sensing. We realized a record beam-steering angle of 16° with 200 resolution points. The integrated chip size is as small as 1 mm.

源语言英语
主期刊名2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781943580767
出版状态已出版 - 5月 2020
已对外发布
活动2020 Conference on Lasers and Electro-Optics, CLEO 2020 - San Jose, 美国
期限: 10 5月 202015 5月 2020

出版系列

姓名Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
2020-May
ISSN(印刷版)1092-8081

会议

会议2020 Conference on Lasers and Electro-Optics, CLEO 2020
国家/地区美国
San Jose
时期10/05/2015/05/20

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