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Solid-Ionic Memory in a van der Waals Heterostructure

  • Jieqiong Chen
  • , Rui Guo
  • , Xiaowei Wang
  • , Chao Zhu
  • , Guiming Cao
  • , Lu You
  • , Ruihuan Duan
  • , Chao Zhu
  • , Shreyash Sudhakar Hadke
  • , Xun Cao
  • , Teddy Salim
  • , Pio John S. Buenconsejo
  • , Manzhang Xu
  • , Xiaoxu Zhao
  • , Jiadong Zhou
  • , Ya Deng
  • , Qingsheng Zeng
  • , Lydia H. Wong
  • , Jingsheng Chen*
  • , Fucai Liu*
  • Zheng Liu*
*此作品的通讯作者
  • Nanyang Technological University
  • National University of Singapore
  • University of Electronic Science and Technology of China
  • Soochow University
  • Research Techno Plaza Singapore

科研成果: 期刊稿件文章同行评审

摘要

Defect states dominate the performance of low-dimensional nanoelectronics, which deteriorate the serviceability of devices in most cases. But in recent years, some intriguing functionalities are discovered by defect engineering. In this work, we demonstrate a bifunctional memory device of a MoS2/BiFeO3/SrTiO3 van der Waals heterostructure, which can be programmed and erased by solely one kind of external stimuli (light or electrical-gate pulse) via engineering of oxygen-vacancy-based solid-ionic gating. The device shows multibit electrical memory capability (>22 bits) with a large linearly tunable dynamic range of 7.1 × 106 (137 dB). Furthermore, the device can be programmed by green- and red-light illuminations and then erased by UV light pulses. Besides, the photoresponse under red-light illumination reaches a high photoresponsivity (6.7 × 104 A/W) and photodetectivity (2.12 × 1013 Jones). These results highlighted solid-ionic memory for building up multifunctional electronic and optoelectronic devices.

源语言英语
页(从-至)221-231
页数11
期刊ACS Nano
16
1
DOI
出版状态已出版 - 25 1月 2022
已对外发布

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