SHREC’20 benchmark: Classification in cryo-electron tomograms
Ilja Gubins*, Marten L. Chaillet, Gijs van der Schot, Remco C. Veltkamp, Friedrich Förster, Yu Hao, Xiaohua Wan, Xuefeng Cui, Fa Zhang, Emmanuel Moebel, Xiao Wang, Daisuke Kihara, Xiangrui Zeng, Min Xu, Nguyen P. Nguyen, Tommi White, Filiz Bunyak
*此作品的通讯作者
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