@inproceedings{310e34eb83ef496c9710a2494019e327,
title = "Self-calibration and high-accuracy detection technology for the probability density of polarization state of a light field",
abstract = "Measurement of the probability density of polarization state need specific phase modulator.However, the existence of mechanic processing error results in the error of the polarization property of modulator. Meanwhile, the error of the measurement system's alignment is also existing. All of this errors need to calibrate to ensure the accuracy of measurement. In this paper, We present a self-calibration method based on the theory of the probability density of polarization state which is represented in Mueller formalism. After measuring the probability density of polarization state, we can extract the Stokes parameters of a light field of unknown polarization in a single irradiance measurement, by finding the maximum of the probability density of polarization state.",
keywords = "Mueller matrix, Polarization measurement, Probability density of polarization state, Self-calibration",
author = "Wenhao Pan and Jianhui Li and Tianlei Ning and Yanqiu Li and Ke Liu and Lihui Liu and Meng Zheng",
note = "Publisher Copyright: {\textcopyright} 2018 SPIE.; International Symposium on Optoelectronic Technology and Application 2018: Optical Precision Manufacturing, Testing, and Applications, OTA 2018 ; Conference date: 22-05-2018 Through 24-05-2018",
year = "2018",
doi = "10.1117/12.2505667",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "McBride, \{John W.\} and Xuejun Zhang and Sen Han and JiuBin Tan",
booktitle = "Optical Precision Manufacturing, Testing, and Applications",
address = "United States",
}