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Resonant Tunneling Spectroscopy to Probe the Giant Stark Effect in Atomically Thin Materials

  • Shoujun Zheng
  • , Sanghyun Jo
  • , Kyungrok Kang
  • , Linfeng Sun
  • , Mali Zhao
  • , Kenji Watanabe
  • , Takashi Taniguchi
  • , Pilkyung Moon
  • , Nojoon Myoung
  • , Heejun Yang*
  • *此作品的通讯作者
  • Sungkyunkwan University
  • Samsung Advanced Institute of Technology
  • National Institute for Materials Science Tsukuba
  • New York University Shanghai and NYU-ECNU Institute of Physics at NYU Shanghai
  • East China Normal University
  • Chosun University

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

Each atomic layer in van der Waals heterostructures possesses a distinct electronic band structure that can be manipulated for unique device operations. In the precise device architecture, the subtle but critical band splits by the giant Stark effect between atomic layers, varied by the momentum of electrons and external electric fields in device operation, has not yet been demonstrated or applied to design original devices with the full potential of atomically thin materials. Here, resonant tunneling spectroscopy based on the negligible quantum capacitance of 2D semiconductors in resonant tunneling transistors is reported. The bandgaps and sub-band structures of various channel materials could be demonstrated by the new conceptual spectroscopy at the device scale without debatable quasiparticle effects. Moreover, the band splits by the giant Stark effect in the channel materials could be probed, overcoming the limitations of conventional optical, photoemission, and tunneling spectroscopy. The resonant tunneling spectroscopy reveals essential and practical information for novel device applications.

源语言英语
期刊论文编号1906942
期刊Advanced Materials
卷32
期12
DOI
出版状态已出版 - 1 3月 2020
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