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Reconstructing spectral reflectance from digital camera through samples selection

  • Beijing Institute of Technology

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Spectral reflectance provides the most fundamental information of objects and is recognized as the "fingerprint" of them, since reflectance is independent of illumination and viewing conditions. However, reconstructing high-dimensional spectral reflectance from relatively low-dimensional camera outputs is an illposed problem and most of methods requaired camera's spectral responsivity. We propose a method to reconstruct spectral reflectance from digital camera outputs without prior knowledge of camera's spectral responsivity. This method respectively averages reflectances of selected subset from main training samples by prescribing a limit to tolerable color difference between the training samples and the camera outputs. Different tolerable color differences of training samples were investigated with Munsell chips under D65 light source. Experimental results show that the proposed method outperforms classic PI method in terms of multiple evaluation criteria between the actual and the reconstructed reflectances. Besides, the reconstructed spectral reflectances are between 0-1, which make them have actual physical meanings and better than traditional methods.

源语言英语
主期刊名Optoelectronic Imaging and Multimedia Technology IV
编辑Qionghai Dai, Tsutomu Shimura
出版商SPIE
ISBN(电子版)9781510604599
DOI
出版状态已出版 - 2016
活动Optoelectronic Imaging and Multimedia Technology IV - Beijing, 中国
期限: 12 10月 201613 10月 2016

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10020
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Optoelectronic Imaging and Multimedia Technology IV
国家/地区中国
Beijing
时期12/10/1613/10/16

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