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Quantum-mathematical model of edge and peak point in Fresnel diffraction through a slit

  • Xiao He Luo
  • , Hui Mei*
  • , Qiu Dong Zhu
  • , Shan Shan Wang
  • , Yin Long Hou
  • *此作品的通讯作者
  • Beijing Institute of Technology

科研成果: 期刊稿件文章同行评审

摘要

The intensity distribution in Fresnel diffraction through a slit includes numerous small fluctuations referred to as ripples. These ripples make the modelling of the intensity distribution complicated. In this study, we examine the characteristics of the Fresnel diffraction intensity distribution to deduce the rule for the peak position and then propose two types of quantum-mathematical models to obtain the distance between the edge and the peak point. The analysis and simulation indicate that the error in the models is below 0.50 μm. The models can also be used to detect the edges of a diffraction object, and we conduct several experiments to measure the slit width. The experimental results reveal that the repetition accuracy of the method can reach 0.23 μm.

源语言英语
期刊论文编号054202
期刊Chinese Physics B
26
5
DOI
出版状态已出版 - 5月 2017
已对外发布

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