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Partial compensation interferometry for measurement of surface parameter error of high-order aspheric surfaces

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Surface parameters are the properties to describe the shape characters of aspheric surface, which mainly include vertex radius of curvature (VROC) and conic constant (CC). The VROC affects the basic properties, such as focal length of an aspheric surface, while the CC is the basis of classification for aspheric surface. The deviations of the two parameters are defined as surface parameter error (SPE). Precisely measuring SPE is critical for manufacturing and aligning aspheric surface. Generally, SPE of aspheric surface is measured directly by curvature fitting on the absolute profile measurement data from contact or non-contact testing. And most interferometry-based methods adopt null compensators or null computer-generated holograms to measure SPE. To our knowledge, there is no effective way to measure SPE of highorder aspheric surface with non-null interferometry. In this paper, based on the theory of slope asphericity and the best compensation distance (BCD) established in our previous work, we propose a SPE measurement method for high-order aspheric surface in partial compensation interferometry (PCI) system. In the procedure, firstly, we establish the system of two element equations by utilizing the SPE-caused BCD change and surface shape change. Then, we can simultaneously obtain the VROC error and CC error in PCI system by solving the equations. Simulations are made to verify the method, and the results show a high relative accuracy.

源语言英语
主期刊名2017 International Conference on Optical Instruments and Technology
主期刊副标题Optical Systems and Modern Optoelectronic Instruments
编辑Baohua Jia, Kimio Tatsuno, Yongtian Wang
出版商SPIE
ISBN(电子版)9781510617438
DOI
出版状态已出版 - 2018
活动2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments - Beijing, 中国
期限: 28 10月 201730 10月 2017

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10616
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
国家/地区中国
Beijing
时期28/10/1730/10/17

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