TY - JOUR
T1 - Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System
AU - Gao, Meijing
AU - Tan, Ailing
AU - Xu, Jie
AU - Jin, Weiqi
AU - Zu, Zhenlong
AU - Yang, Ming
N1 - Publisher Copyright:
© 2018 Editorial Department of Journal of Beijing Institute of Technology.
PY - 2018/3/1
Y1 - 2018/3/1
N2 - Based on a strong inter-diagonal matrix and Taylor series expansions, an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2×2 microscanning undersampling images from the real irregular undersampling images, and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system's spatial resolution. The algorithm is simple, fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.
AB - Based on a strong inter-diagonal matrix and Taylor series expansions, an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2×2 microscanning undersampling images from the real irregular undersampling images, and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system's spatial resolution. The algorithm is simple, fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.
KW - Optical microscanning
KW - Oversample reconstruction
KW - Strong inter-diagonal matrix
KW - Thermal microscope imaging system
UR - https://www.scopus.com/pages/publications/85046160232
U2 - 10.15918/j.jbit1004-0579.201827.0109
DO - 10.15918/j.jbit1004-0579.201827.0109
M3 - Article
AN - SCOPUS:85046160232
SN - 1004-0579
VL - 27
SP - 65
EP - 73
JO - Journal of Beijing Institute of Technology (English Edition)
JF - Journal of Beijing Institute of Technology (English Edition)
IS - 1
ER -