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Out-of-plane and in-plane ferroelectricity of atom-thick two-dimensional InSe

  • Haowen Hu
  • , Huaipeng Wang
  • , Yilin Sun
  • , Jiawei Li
  • , Jinliang Wei
  • , Dan Xie*
  • , Hongwei Zhu*
  • *此作品的通讯作者
  • Tsinghua University

科研成果: 期刊稿件文章同行评审

摘要

Two-dimensional (2D) ferroelectric materials are promising substitutes of three-dimensional perovskite based ferroelectric ceramic materials. Yet most studies have been focused on the construction of non-centrosymmetric 2D van der Waals materials and only a few are constructed experimentally. Herein, we experimentally demonstrate the co-existence of voltage-tunable out-of-plane (OOP) and in-plane (IP) ferroelectricity in few-layer InSe prepared by a solution-processable method and fabricate ferroelectric semiconductor channel transistors. The reversible polarization can initiate instant switch of resistance with high ON/OFF ratios and a comparable subthreshold swing of 160 mV/dec under gate modulation. The origins of such unique OOP and IP ferroelectricity of the centrosymmetric structure are theoretically analyzed.

源语言英语
文章编号385202
期刊Nanotechnology
32
38
DOI
出版状态已出版 - 17 9月 2021

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