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Optimized laser beam widths meter calibration system: Precisely positioning of detector measurement plane

  • Beijing Institute of Technology
  • National Institute of Metrology China

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The direct substitution method is used in the laser beam widths meter (usually the laser beam profiler) calibration. The laser beam widths measurement results of device under test (DUT) are compared with those made by the laboratory standard. For most laser beam widths meter, the detector measurement plane is installed inside detector head, so it is difficult to accurately position the measurement plane for both standard and DUT. Depending on the ocular estimation, the difference of measurement plane between standard and DUT is usually controlled within 5mm. For 2.5mrad divergence angle of laser beam, 5mm tolerance will cause an uncertainty of 12.5μm in the beam widths measurement. In the optimized calibration system, a wedge prism placed in the beam path produces a precise beam deflection, which results in the laser spot displacement on the measurement plane. Depending on the measurable displacement of beam centroid position and the beam deflection angle, the distance from the wedge prism to the detector measurement plane is determined. The experimental results show that using the measurement plane positioning method, the difference of measurement plane between standard and DUT is close to 80 μm, only contributing an uncertainty of 0.125 μm in final result with the same 2.5mrad beam divergence angle. In additional, some factors affecting precisely positioning of measurement plane are analyzed in this paper.

源语言英语
主期刊名2013 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems
出版商SPIE
ISBN(印刷版)9780819499646
DOI
出版状态已出版 - 2013
活动2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Beijing, 中国
期限: 17 11月 201319 11月 2013

丛书

姓名Proceedings of SPIE - The International Society for Optical Engineering
9046
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
国家/地区中国
Beijing
时期17/11/1319/11/13

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