Nanometre moire fringes in scanning tunnelling microscopy of surface lattices

H. M. Guo; H. W. Liu; Y. L. Wang; H. J. Gao; H. X. Shang; Z. W. Liu; H. M. Xie; F. L. Dai

doi:10.1088/0957-4484/15/8/022

Nanometre moire fringes in scanning tunnelling microscopy of surface lattices

H. M. Guo
, H. W. Liu
, Y. L. Wang
, H. J. Gao^*
, H. X. Shang
, Z. W. Liu
, H. M. Xie
, F. L. Dai

^*此作品的通讯作者

CAS - Institute of Physics
Tsinghua University

科研成果: 期刊稿件 › 文章 › 同行评审

12 引用（Scopus）

摘要

A novel class of moire fringe patterns in scanning tunnelling microscope (STM) imaging is presented and analysed in this paper. The moire fringe is generated from the interference of the atomic lattice of the specimen and STM scanning lines. Both parallel and rotational STM moire fringes of the surface of highly oriented pyrolytic graphite (HOPG) are investigated. The formation principle and experimental techniques of STM moire fringes are discussed. Nanometre scale resolution and sensitivity are found in the moire fringe patterns. They precisely magnify the STM image of lattice irregularities. A potential application - measuring surface deformation and defects in the nanometre range - is proposed.

源语言	英语
页（从-至）	991-995
页数	5
期刊	Nanotechnology
卷	15
期	8
DOI	https://doi.org/10.1088/0957-4484/15/8/022
出版状态	已出版 - 8月 2004
已对外发布	是

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title = "Nanometre moire fringes in scanning tunnelling microscopy of surface lattices",

abstract = "A novel class of moire fringe patterns in scanning tunnelling microscope (STM) imaging is presented and analysed in this paper. The moire fringe is generated from the interference of the atomic lattice of the specimen and STM scanning lines. Both parallel and rotational STM moire fringes of the surface of highly oriented pyrolytic graphite (HOPG) are investigated. The formation principle and experimental techniques of STM moire fringes are discussed. Nanometre scale resolution and sensitivity are found in the moire fringe patterns. They precisely magnify the STM image of lattice irregularities. A potential application - measuring surface deformation and defects in the nanometre range - is proposed.",

author = "Guo, \{H. M.\} and Liu, \{H. W.\} and Wang, \{Y. L.\} and Gao, \{H. J.\} and Shang, \{H. X.\} and Liu, \{Z. W.\} and Xie, \{H. M.\} and Dai, \{F. L.\}",

year = "2004",

month = aug,

doi = "10.1088/0957-4484/15/8/022",

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pages = "991--995",

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T1 - Nanometre moire fringes in scanning tunnelling microscopy of surface lattices

AU - Guo, H. M.

AU - Liu, H. W.

AU - Wang, Y. L.

AU - Gao, H. J.

AU - Shang, H. X.

AU - Liu, Z. W.

AU - Xie, H. M.

AU - Dai, F. L.

PY - 2004/8

Y1 - 2004/8

N2 - A novel class of moire fringe patterns in scanning tunnelling microscope (STM) imaging is presented and analysed in this paper. The moire fringe is generated from the interference of the atomic lattice of the specimen and STM scanning lines. Both parallel and rotational STM moire fringes of the surface of highly oriented pyrolytic graphite (HOPG) are investigated. The formation principle and experimental techniques of STM moire fringes are discussed. Nanometre scale resolution and sensitivity are found in the moire fringe patterns. They precisely magnify the STM image of lattice irregularities. A potential application - measuring surface deformation and defects in the nanometre range - is proposed.

AB - A novel class of moire fringe patterns in scanning tunnelling microscope (STM) imaging is presented and analysed in this paper. The moire fringe is generated from the interference of the atomic lattice of the specimen and STM scanning lines. Both parallel and rotational STM moire fringes of the surface of highly oriented pyrolytic graphite (HOPG) are investigated. The formation principle and experimental techniques of STM moire fringes are discussed. Nanometre scale resolution and sensitivity are found in the moire fringe patterns. They precisely magnify the STM image of lattice irregularities. A potential application - measuring surface deformation and defects in the nanometre range - is proposed.

UR - https://www.scopus.com/pages/publications/4344584560

U2 - 10.1088/0957-4484/15/8/022

DO - 10.1088/0957-4484/15/8/022

M3 - Article

AN - SCOPUS:4344584560

SN - 0957-4484

VL - 15

SP - 991

EP - 995

JO - Nanotechnology

JF - Nanotechnology

IS - 8

ER -

Nanometre moire fringes in scanning tunnelling microscopy of surface lattices

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