摘要
In this paper, a novel nano-moiré grating fabrication technique was proposed for nanometer deformation measurement. The grating fabrication process was performed with the aid of Atomic Force Microscope (AFM) on the basis of micro-fabrication technique. On the analysis of some correlative factors of influencing grating line quality, some important experimental parameters were optimized. In this study, some parallel and cross nano-gratings with frequencies of from 10000lines/mm to 20000lines/mm were fabricated. The successful experimental results demonstrate that the nano-grating fabrication technique is feasible and also indicated that these nano-gratings with nano-moiré method can be applied to deformation measurement, which offers a nanometer sensitivity and spatial resolution.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 131-134 |
| 页数 | 4 |
| 期刊 | Key Engineering Materials |
| 卷 | 326-328 I |
| DOI | |
| 出版状态 | 已出版 - 2006 |
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