Modification of FA0.85MA0.15Pb(I0.85Br0.15)3 films by NH2-POSS

Yangyang Zhang; Na Liu; Haipeng Xie; Jia Liu; Pan Yuan; Junhua Wei; Yuan Zhao; Baopeng Yang; Jianhua Zhang; Shitan Wang; Han Huang; Dongmei Niu; Qi Chen; Yongli Gao

doi:10.3390/cryst11121544

Modification of FA_0.85MA_0.15Pb(I_0.85Br_0.15)₃ films by NH₂-POSS

Yangyang Zhang
, Na Liu
, Haipeng Xie^*
, Jia Liu
, Pan Yuan
, Junhua Wei
, Yuan Zhao
, Baopeng Yang
, Jianhua Zhang
, Shitan Wang
, Han Huang
, Dongmei Niu
, Qi Chen
, Yongli Gao

^*此作品的通讯作者

Institute of Super-Microstructure and Ultrafast Process in Advance Materials
School of Physics
Beijing Institute of Technology
Department of Physics and Astronomy
University of Rochester

科研成果: 期刊稿件 › 文章 › 同行评审

5 引用（Scopus）

摘要

The surface composition and morphology of FA_0.85MA_0.15Pb(I_0.85Br_0.15)₃ films fabricated by the spin-coating method with different concentrations of NH₂-POSS were investigated with atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), angle-resolved X-ray photoelectron spectroscopy (AR-XPS), and Fourier transform infrared spectroscopy (FTIR). It was found that the surface composition of the FA_0.85MA_0.15Pb(I_0.85Br_0.15)₃ films was changed regularly through the interaction between NH₂-POSS and the perovskite film. The corresponding surface morphological changes were also observed. When the concentration of NH₂-POSS exceeded 10 mg/mL, a lot of cracks on the surface of the perovskite film were observed and the surface morphology was damaged. The surface composition and its distribution can be adjusted by changing the concentration of NH₂-POSS and the proper concentration of NH₂-POSS can substantially improve the quality of perovskite film.

源语言	英语
期刊论文编号	1544
期刊	Crystals
卷	11
期	12
DOI	https://doi.org/10.3390/cryst11121544
出版状态	已出版 - 12月 2021
已对外发布	是

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10.3390/cryst11121544

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@article{4c823e0f56a544bb8894ff129eb6db65,

title = "Modification of FA0.85MA0.15Pb(I0.85Br0.15)3 films by NH2-POSS",

abstract = "The surface composition and morphology of FA0.85MA0.15Pb(I0.85Br0.15)3 films fabricated by the spin-coating method with different concentrations of NH2-POSS were investigated with atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), angle-resolved X-ray photoelectron spectroscopy (AR-XPS), and Fourier transform infrared spectroscopy (FTIR). It was found that the surface composition of the FA0.85MA0.15Pb(I0.85Br0.15)3 films was changed regularly through the interaction between NH2-POSS and the perovskite film. The corresponding surface morphological changes were also observed. When the concentration of NH2-POSS exceeded 10 mg/mL, a lot of cracks on the surface of the perovskite film were observed and the surface morphology was damaged. The surface composition and its distribution can be adjusted by changing the concentration of NH2-POSS and the proper concentration of NH2-POSS can substantially improve the quality of perovskite film.",

keywords = "Morphology, NH-POSS, Perovskite film, Photoemission spectroscopy, Surface composition",

author = "Yangyang Zhang and Na Liu and Haipeng Xie and Jia Liu and Pan Yuan and Junhua Wei and Yuan Zhao and Baopeng Yang and Jianhua Zhang and Shitan Wang and Han Huang and Dongmei Niu and Qi Chen and Yongli Gao",

note = "Publisher Copyright: {\textcopyright} 2021 by the authors. Licensee MDPI, Basel, Switzerland.",

year = "2021",

month = dec,

doi = "10.3390/cryst11121544",

language = "English",

volume = "11",

journal = "Crystals",

issn = "2073-4352",

number = "12",

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TY - JOUR

T1 - Modification of FA0.85MA0.15Pb(I0.85Br0.15)3 films by NH2-POSS

AU - Zhang, Yangyang

AU - Liu, Na

AU - Xie, Haipeng

AU - Liu, Jia

AU - Yuan, Pan

AU - Wei, Junhua

AU - Zhao, Yuan

AU - Yang, Baopeng

AU - Zhang, Jianhua

AU - Wang, Shitan

AU - Huang, Han

AU - Niu, Dongmei

AU - Chen, Qi

AU - Gao, Yongli

PY - 2021/12

Y1 - 2021/12

N2 - The surface composition and morphology of FA0.85MA0.15Pb(I0.85Br0.15)3 films fabricated by the spin-coating method with different concentrations of NH2-POSS were investigated with atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), angle-resolved X-ray photoelectron spectroscopy (AR-XPS), and Fourier transform infrared spectroscopy (FTIR). It was found that the surface composition of the FA0.85MA0.15Pb(I0.85Br0.15)3 films was changed regularly through the interaction between NH2-POSS and the perovskite film. The corresponding surface morphological changes were also observed. When the concentration of NH2-POSS exceeded 10 mg/mL, a lot of cracks on the surface of the perovskite film were observed and the surface morphology was damaged. The surface composition and its distribution can be adjusted by changing the concentration of NH2-POSS and the proper concentration of NH2-POSS can substantially improve the quality of perovskite film.

AB - The surface composition and morphology of FA0.85MA0.15Pb(I0.85Br0.15)3 films fabricated by the spin-coating method with different concentrations of NH2-POSS were investigated with atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), angle-resolved X-ray photoelectron spectroscopy (AR-XPS), and Fourier transform infrared spectroscopy (FTIR). It was found that the surface composition of the FA0.85MA0.15Pb(I0.85Br0.15)3 films was changed regularly through the interaction between NH2-POSS and the perovskite film. The corresponding surface morphological changes were also observed. When the concentration of NH2-POSS exceeded 10 mg/mL, a lot of cracks on the surface of the perovskite film were observed and the surface morphology was damaged. The surface composition and its distribution can be adjusted by changing the concentration of NH2-POSS and the proper concentration of NH2-POSS can substantially improve the quality of perovskite film.

KW - Morphology

KW - NH-POSS

KW - Perovskite film

KW - Photoemission spectroscopy

KW - Surface composition

UR - https://www.scopus.com/pages/publications/85121580827

U2 - 10.3390/cryst11121544

DO - 10.3390/cryst11121544

M3 - Article

AN - SCOPUS:85121580827

SN - 2073-4352

VL - 11

JO - Crystals

JF - Crystals

IS - 12

M1 - 1544

ER -

Modification of FA0.85MA0.15Pb(I0.85Br0.15)3 films by NH2-POSS

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Modification of FA_0.85MA_0.15Pb(I_0.85Br_0.15)₃ films by NH₂-POSS